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Showing items 11-20 of 214  (22 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2019-04-02T05:58:27Z Low-temperature and low thermal budget fabrication of polycrystalline silicon thin-film transistors Lin, HY; Chang, CY; Lei, TF; Liu, FM; Yang, WL; Cheng, JY; Tseng, HC; Chen, LP
國立交通大學 2014-12-08T15:49:22Z Correlation of stress-induced leakage current with generated positive trapped charges for ultrathin gate oxide Lin, YH; Lee, CL; Lei, TF
國立交通大學 2014-12-08T15:49:13Z Characterization of polysilicon oxides thermally grown and deposited on the polished polysilicon films Lei, TF; Cheng, JY; Shiau, SY; Chao, TS; Lai, CS
國立交通大學 2014-12-08T15:48:55Z Comparison of N-2 and NH3 plasma passivation effects on polycrystalline silicon thin-film transistors Lee, YS; Lin, HY; Lei, TF; Huang, TY; Chang, TC; Chang, CY
國立交通大學 2014-12-08T15:48:54Z Controlling the diffusion of implanted boron in Si and silicide by multiple implants Chu, CH; Ho, KJ; Huang, CT; Shvu, SH; Lei, TF
國立交通大學 2014-12-08T15:47:36Z Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation Lai, CS; Chao, TS; Lei, TF; Lee, CL; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:46:44Z Improvement of ultra-thin 3.3 nm thick oxide for co-salicide process using NF3 annealed poly-gate Chang, TY; Lei, TF; Chao, TS; Huang, CT; Chen, SK; Tuan, A; Chou, S
國立交通大學 2014-12-08T15:46:40Z Enhancement of integrity of polysilicon oxide by using a combination of N2O nitridation and CMP process Lei, TF; Chen, JH; Wang, MF; Chao, TS
國立交通大學 2014-12-08T15:46:12Z A novel Si-B diffusion source for p(+)-poly-Si gate Chao, TS; Kuo, CP; Chen, TP; Lei, TF
國立交通大學 2014-12-08T15:46:06Z Improvement of junction leakage of nickel silicided junction by a Ti-capping layer Hou, TH; Lei, TF; Chao, TS

Showing items 11-20 of 214  (22 Page(s) Totally)
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