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Taiwan Academic Institutional Repository >
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"lei tf"
Showing items 101-125 of 214 (9 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:17:43Z |
The CMP process and cleaning solution for planarization of strain-relaxed SiGe virtual substrates in MOSFET applications
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Shieh, MS; Chen, PS; Tsai, MJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:42Z |
Physical characterization and electrical properties of sol-gel-derived zirconia films
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You, HC; Fu-Hsiang, K; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:02Z |
High-performance poly-Si TFTs with fully Ni-self-aligned silicided S/D and gate structure
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Kuo, PY; Chao, TS; Wang, RJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:01Z |
Mismatches after hot-carrier injection in advanced complementary metal-oxide-semiconductor technology particularly for analog applications
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Chen, SY; Lin, JC; Chen, HW; Lin, HC; Jhou, ZW; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立交通大學 |
2014-12-08T15:16:57Z |
Electrical characteristics and reliability of multi-channel polycrystalline silicon thin-film transistors
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Shieh, MS; Sang, JY; Chen, CY; Wang, SD; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
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Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立交通大學 |
2014-12-08T15:16:53Z |
Novel two-bit HfO2 nanocrystal nonvolatile flash memory
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Lin, YH; Chien, CH; Lin, CT; Chang, CY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:51Z |
Fullerene-incorporation for enhancing the electron beam resist performance for contact hole patterning and filling
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You, HC; Ko, FH; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:41Z |
Annealing temperature effect on the performance of nonvolatile HfO2Si-oxide-nitride-oxide-silicon-type flash memory
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Lin, YH; Chien, CH; Chang, CY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:06:32Z |
SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM
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LEI, TF; LEE, CL; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:06:32Z |
TI-TIO2 GATED MOS DIODE LIGHT SENSOR
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CHANG, CY; KAO, CW; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:31Z |
METAL-N-GAP SCHOTTKY-BARRIER HEIGHTS
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LEI, TF; LEE, CL; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:06:26Z |
DEPLETION WIDTHS OF THE METAL-INSULATOR SEMICONDUCTOR (MIS) STRUCTURE
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JEN, CW; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:15Z |
A SIMPLE METHOD FOR SINGLE-FREQUENCY OPERATION AND AMPLITUDE-STABILIZATION AND FREQUENCY-STABILIZATION OF AN INTERNAL-MIRROR HE-NE-LASER
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PAN, CL; KUO, CC; HSIEH, TC; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:14Z |
SENSITIVITY OF FREQUENCY STABILITY OF 2-MODE INTERNAL-MIRROR HE-NE LASERS TO MISALIGNMENT OF POLARIZING OPTICS
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PAN, CL; JEAN, PY; KUO, CC; HSIEH, TC; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:12Z |
SELECTIVE EPITAXY ON SILICON BY ATMOSPHERIC-PRESSURE SIH4-HCL CVD
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HSIEH, TP; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:11Z |
A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY
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LEI, TF; LEU, LY; LEE, CL |
| 國立交通大學 |
2014-12-08T15:06:03Z |
ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A
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HO, JH; LEE, CL; JEN, CW; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:01Z |
THE PD-ZN SYSTEM FOR OHMIC CONTACTS TO P-TYPE GAP
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LEI, TF; JENG, GK |
| 國立交通大學 |
2014-12-08T15:06:00Z |
THE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITY
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LEE, CL; YANG, WL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:57Z |
ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:53Z |
TANTALUM SILICIDE SCHOTTKY CONTACTS TO GAAS
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LEE, CP; LIU, TH; LEI, TF; WU, SC |
| 國立交通大學 |
2014-12-08T15:05:52Z |
SWITCHING CHARACTERISTICS OF MINPN DEVICES
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:51Z |
AN MINPIM STRUCTURE MIXING DEVICE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:48Z |
A SWITCHING DEVICE OF A PN JUNCTION STRUCTURE WITH 2 LAYERS OF THIN OXIDE
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CHANG, DCY; LEE, CL; LEI, TF |
Showing items 101-125 of 214 (9 Page(s) Totally)
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