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Showing items 176-185 of 214  (22 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:03:22Z HIGH-BARRIER PT/AL/N-INP DIODE HUANG, WC; LEI, TF; LEE, CL
國立交通大學 2014-12-08T15:03:21Z INVESTIGATION ON THE DISTRIBUTION OF FLUORINE AND BORON IN POLYCRYSTALLINE SILICON SILICON SYSTEMS CHEN, TP; LEI, TF; CHANG, CY; HSIEH, WY; CHEN, LJ
國立交通大學 2014-12-08T15:03:20Z ENHANCED H-2-PLASMA EFFECTS ON POLYSILICON THIN-FILM TRANSISTORS WITH THIN ONO GATE-DIELECTRICS YANG, CK; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:03:16Z AN ANALYTICAL MODEL FOR THE ABOVE-THRESHOLD CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS CHERN, HN; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:03:15Z A DOUBLE METAL STRUCTURE PT/AL/N-INP DIODE HUANG, WC; LEI, TF; LEE, CL
國立交通大學 2014-12-08T15:03:13Z THE ELECTRICAL CHARACTERISTICS OF POLYSILICON OXIDE GROWN IN PURE N2O LAI, CS; LEI, TF; LEE, CL
國立交通大學 2014-12-08T15:03:10Z A NOVEL PLANARIZATION OF TRENCH ISOLATION USING POLYSILICON REFILL AND ETCHBACK OF CHEMICAL-MECHANICAL POLISH CHENG, JY; LEI, TF; CHAO, TS
國立交通大學 2014-12-08T15:03:07Z HIGH BREAKDOWN VOLTAGE SCHOTTKY-BARRIER DIODE USING P(+)-POLYCRYSTALLINE SILICON DIFFUSED GUARD RING LIOU, BW; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:03:06Z POST-POLYSILICON GATE-PROCESS-INDUCED DEGRADATION ON THIN GATE OXIDE LAI, CS; LEI, TF; LEE, CL; CHAO, TS
國立交通大學 2014-12-08T15:03:04Z PTGE OHMIC CONTACT TO N-TYPE INP HUANG, WC; LEI, TF; LEE, CL

Showing items 176-185 of 214  (22 Page(s) Totally)
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