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Showing items 96-145 of 214 (5 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:18:30Z |
Drain/gate-voltage-dependent on-current and off-current instabilities in polycrystalline silicon thin-film transistors under electrical stress
|
Wang, SD; Chang, TY; Lo, WH; Sang, JY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:18:21Z |
A novel dynamic threshold voltage MOSFET (DTMOS) using heterostructure channel of Si1-yCy interlayer
|
Shieh, MS; Chen, PS; Tsai, MJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:18:20Z |
Novel single-poly EEPROM with damascene control-gate structure
|
Sung, HC; Lei, TF; Hsu, TH; Wang, SW; Kao, YC; Lin, YT; Wang, CS |
| 國立交通大學 |
2014-12-08T15:18:15Z |
New triple self-aligned (SA3) split-gate flash cell with T-shaped source coupling
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Sung, HC; Lei, TF; Huang, CM; Kao, YC; Lin, YT; Wang, CS |
| 國立交通大學 |
2014-12-08T15:18:03Z |
Pentacene-based thin film transistors used to drive a twist-nematic liquid crystal display
|
Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:17:43Z |
The CMP process and cleaning solution for planarization of strain-relaxed SiGe virtual substrates in MOSFET applications
|
Shieh, MS; Chen, PS; Tsai, MJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:42Z |
Physical characterization and electrical properties of sol-gel-derived zirconia films
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You, HC; Fu-Hsiang, K; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:02Z |
High-performance poly-Si TFTs with fully Ni-self-aligned silicided S/D and gate structure
|
Kuo, PY; Chao, TS; Wang, RJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:01Z |
Mismatches after hot-carrier injection in advanced complementary metal-oxide-semiconductor technology particularly for analog applications
|
Chen, SY; Lin, JC; Chen, HW; Lin, HC; Jhou, ZW; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立交通大學 |
2014-12-08T15:16:57Z |
Electrical characteristics and reliability of multi-channel polycrystalline silicon thin-film transistors
|
Shieh, MS; Sang, JY; Chen, CY; Wang, SD; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
|
Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立交通大學 |
2014-12-08T15:16:53Z |
Novel two-bit HfO2 nanocrystal nonvolatile flash memory
|
Lin, YH; Chien, CH; Lin, CT; Chang, CY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:51Z |
Fullerene-incorporation for enhancing the electron beam resist performance for contact hole patterning and filling
|
You, HC; Ko, FH; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:41Z |
Annealing temperature effect on the performance of nonvolatile HfO2Si-oxide-nitride-oxide-silicon-type flash memory
|
Lin, YH; Chien, CH; Chang, CY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:06:32Z |
SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM
|
LEI, TF; LEE, CL; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:06:32Z |
TI-TIO2 GATED MOS DIODE LIGHT SENSOR
|
CHANG, CY; KAO, CW; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:31Z |
METAL-N-GAP SCHOTTKY-BARRIER HEIGHTS
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LEI, TF; LEE, CL; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:06:26Z |
DEPLETION WIDTHS OF THE METAL-INSULATOR SEMICONDUCTOR (MIS) STRUCTURE
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JEN, CW; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:15Z |
A SIMPLE METHOD FOR SINGLE-FREQUENCY OPERATION AND AMPLITUDE-STABILIZATION AND FREQUENCY-STABILIZATION OF AN INTERNAL-MIRROR HE-NE-LASER
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PAN, CL; KUO, CC; HSIEH, TC; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:14Z |
SENSITIVITY OF FREQUENCY STABILITY OF 2-MODE INTERNAL-MIRROR HE-NE LASERS TO MISALIGNMENT OF POLARIZING OPTICS
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PAN, CL; JEAN, PY; KUO, CC; HSIEH, TC; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:12Z |
SELECTIVE EPITAXY ON SILICON BY ATMOSPHERIC-PRESSURE SIH4-HCL CVD
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HSIEH, TP; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:11Z |
A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY
|
LEI, TF; LEU, LY; LEE, CL |
| 國立交通大學 |
2014-12-08T15:06:03Z |
ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A
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HO, JH; LEE, CL; JEN, CW; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:01Z |
THE PD-ZN SYSTEM FOR OHMIC CONTACTS TO P-TYPE GAP
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LEI, TF; JENG, GK |
| 國立交通大學 |
2014-12-08T15:06:00Z |
THE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITY
|
LEE, CL; YANG, WL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:57Z |
ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS
|
HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:53Z |
TANTALUM SILICIDE SCHOTTKY CONTACTS TO GAAS
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LEE, CP; LIU, TH; LEI, TF; WU, SC |
| 國立交通大學 |
2014-12-08T15:05:52Z |
SWITCHING CHARACTERISTICS OF MINPN DEVICES
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:51Z |
AN MINPIM STRUCTURE MIXING DEVICE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:48Z |
A SWITCHING DEVICE OF A PN JUNCTION STRUCTURE WITH 2 LAYERS OF THIN OXIDE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:46Z |
REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
|
HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:39Z |
NUMERICAL-SIMULATION OF THE VERTICAL KELVIN TEST STRUCTURE FOR SPECIFIC CONTACT RESISTIVITY
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LEU, LY; LEE, CL; LEI, TF; YANG, WL |
| 國立交通大學 |
2014-12-08T15:05:38Z |
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
|
HO, JH; LEE, CL; LEI, TF; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:05:37Z |
IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:32Z |
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
|
HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:26Z |
IMPROVEMENT OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON-CONTACTED DIODES AFTER FORWARD BIAS STRESSING
|
WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:25Z |
AN SCR WITH SIMPLE MIS STRUCTURE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:14Z |
MEASUREMENT OF ULTRATHIN (LESS-THAN-100-A) OXIDE-FILMS BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
|
CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:11Z |
A REAL-TIME C-V MEASUREMENT CIRCUIT FOR MOS CAPACITORS UNDER CURRENT STRESSING
|
LEE, CL; LEI, TF; HO, JH; WANG, WT |
| 國立交通大學 |
2014-12-08T15:05:03Z |
HIGH-PERFORMANCE POLYSILICON CONTACTED SHALLOW JUNCTIONS FORMED BY STACKED-AMORPHOUS-SILICON FILMS
|
WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:52Z |
POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE FOR ELLIPSOMETRY MEASUREMENT
|
CHAO, TS; LEE, CL; LEI, TF; YEN, YT |
| 國立交通大學 |
2014-12-08T15:04:50Z |
INVESTIGATION ON THE INTERFACE OF THE POLYCRYSTALLINE SILICON CONTACTED DIODE FORMED WITH A STACKED AMORPHOUS-SILICON FILM
|
WU, SL; LEE, CL; LEI, TF; LEE, TL; CHEN, LJ |
| 國立交通大學 |
2014-12-08T15:04:48Z |
CHARACTERIZATION OF ULTRATHIN OXIDE PREPARED BY LOW-TEMPERATURE WAFER LOADING AND NITROGEN PREANNEALING BEFORE OXIDATION
|
WU, SL; LEE, CL; LEI, TF; LIANG, MS |
| 國立交通大學 |
2014-12-08T15:04:45Z |
A STUDY OF THE INTERFACIAL LAYER OF AL AND AL(1-PERCENT SI)-SI CONTACTS USING A ZERO-LAYER ELLIPSOMETRY MODEL
|
CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:42Z |
THE IMPACT OF TITANIUM SILICIDE ON THE CONTACT RESISTANCE FOR SHALLOW JUNCTION FORMED BY OUT-DIFFUSION OF ARSENIC FROM POLYSILICON
|
YANG, WL; LEI, TF; HUANG, CT; LEE, CL |
| 國立交通大學 |
2014-12-08T15:04:37Z |
H-2/O-2 PLASMA ON POLYSILICON THIN-FILM TRANSISTOR
|
CHERN, HN; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESS
|
WU, SL; LIN, TY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:31Z |
THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
|
CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
ULTRATHIN TEXTURED POLYCRYSTALLINE OXIDE WITH A HIGH ELECTRON CONDUCTION EFFICIENCY PREPARED BY THERMAL-OXIDATION OF THIN POLYCRYSTALLINE SILICON FILM ON N+ POLYCRYSTALLINE SILICON
|
WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
THICKNESS DETERMINATION OF POLY-SI/POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE BY ELLIPSOMETER
|
CHAO, TS; LEE, CL; LEI, TF |
Showing items 96-145 of 214 (5 Page(s) Totally)
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