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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"li j c m"的相關文件
顯示項目 31-40 / 40 (共4頁)
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每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2018-09-10T04:15:41Z |
Diagnosis for Sequence Dependent Chips
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Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Testing for Resistive and Stuck Opens
|
Li, J. C.M.; Tseng, C.W.; E.J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Diagnosis of Tunneling Opens
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Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI |
| 國立臺灣大學 |
2010 |
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in
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Kao, Wei-Chung; Chuang, Wei-Shun; Lin, Hsiu-Ting; Li, J.C.-M.; Manquinho, V. |
| 國立臺灣大學 |
2009 |
Time-space test response compaction and diagnosis based on BCH codes
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Wang, F.-M.; Wang, W.-C.; Li, J.C.-M. |
| 國立臺灣大學 |
2008 |
Simultaneous capture and shift power reduction test pattern generator for scan testing
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Lin, H.-T.; Li, J.C.-M. |
| 國立臺灣大學 |
2008 |
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners
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Li, J. C.-M.; Lin, P.-C.; Chiang, P.-C.; Pan, C.-M.; Tseng, C.W. |
| 國立臺灣大學 |
2008 |
Survey of Scan Chain Diagnosis
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Huang, Y.; Guo, R; Cheng, W.T.; Li, J. C.-M. |
| 國立臺灣大學 |
2005-11 |
Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains
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Lin, Hung-Mao; Li, J.C.M. |
| 國立臺灣大學 |
2005-05 |
Jump scan: a DFT technique for low power testing
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Chiu, Min-Hao; Li, J.C.M. |
顯示項目 31-40 / 40 (共4頁)
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