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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:43:54Z Investigations of effects of bias polarization and chemical parameters on morphology and filling capability of 130 nm damascene electroplated copper Chang, SC; Shieh, JM; Lin, KC; Dai, BT; Wang, TC; Chen, CF; Feng, MS; Li, YH; Lu, CP
國立交通大學 2014-12-08T15:42:14Z Wetting effect on gap filling submicron damascene by an electrolyte free of levelers Chang, SC; Shieh, JM; Lin, KC; Dai, BT; Wang, TC; Chen, CF; Feng, MS; Li, YH; Lu, CP
國立交通大學 2014-12-08T15:42:01Z The effect of plating current densities on self-annealing Behaviors of electroplated copper films Chang, SC; Shieh, JM; Dai, BT; Feng, MS; Li, YH
國立交通大學 2014-12-08T15:42:00Z Microleveling mechanisms and applications of electropolishing on planarization of copper metallization Chang, SC; Shieh, JM; Huang, CC; Dai, BT; Li, YH; Feng, MS
國立交通大學 2014-12-08T15:41:49Z Leveling effects of copper electrolytes with hybrid-mode additives Lin, KC; Shieh, JM; Chang, SC; Dai, BT; Chen, CF; Feng, MS; Li, YH
國立交通大學 2014-12-08T15:40:54Z Superpolishing for planarizing copper damascene interconnects Chang, SC; Shieh, JM; Dai, BT; Feng, MS; Li, YH; Shih, CH; Tsai, MH; Shue, SL; Liang, RS; Wang, YL
國立交通大學 2014-12-08T15:40:42Z Stability investigation of single-wafer process by using a spin etcher Kang, TK; Wang, CC; Tsui, BY; Yang, WL; Chien, FT; Yang, SY; Chang, CY; Li, YH
國立交通大學 2014-12-08T15:40:24Z A one-step single-cleaning solution for CMOS processes Chao, TS; Yeh, CH; Pan, TM; Lei, TF; Li, YH
國立交通大學 2014-12-08T15:26:19Z A novel wafer reclaim method for silicon carbide film Tsui, BY; Fang, KL; Wu, CH; Li, YH
國立交通大學 2014-12-08T15:17:00Z The port-to-port isolation of the downconversion P-type micromixer using different N-well topologies Tseng, SC; Meng, CC; Li, YH; Huang, GW

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