| 國立交通大學 |
2014-12-08T15:24:49Z |
Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:48Z |
Propagation Delay Dependence on Channel Fins and Geometry Aspect Ratio of 16-nm Multi-Gate MOSFET Inverter
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:46Z |
Evaluation of account receivable collection alternatives with fuzzy MCDM methodology
|
Hung, Chih-Young; Li, Yiming; Chiang, Yi-Hui |
| 國立交通大學 |
2014-12-08T15:24:43Z |
A unified optimization framework for real world problems
|
Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:24:38Z |
A distributed simulation-based computational intelligence algorithm for nanoscale semiconductor device inverse problem
|
Li, Yiming; Chen, Cheng-Kai |
| 國立交通大學 |
2014-12-08T15:24:27Z |
Threshold Voltage Fluctuation in 16-nm-Gate FinFETs Induced by Random Work Function of Nanosized Metal Grain
|
Li, Yiming; Cheng, Hui-Wen; Hwang, Chi-Hong |
| 國立交通大學 |
2014-12-08T15:24:19Z |
Modeling of Price Effects for the Adoption of LCD TV
|
Tsai, Bi-Huei; Li, Yiming; Lee, Guan-Hua |
| 國立交通大學 |
2014-12-08T15:24:17Z |
Velocity-direction dependent transmission coefficient of electron through potential barrier grown on anisotropic semiconductor
|
Chen, Chun-Nan; Chang, Sheng-Hsiung; Su, Wei-Long; Jen, Jen-Yi; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Parameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD Panel
|
Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:03Z |
Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Characteristics Variability of Novel Lateral Asymmetry Nano-MOSFETs due to Random Discrete Dopant
|
Lee, Kou-Fu; Hwang, Chih-Hong; Li, Tien-Yeh; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:44Z |
Effect of Flash Lamp Annealing and Laser Spike Annealing on Random Dopant Fluctuation of 15-nm Metal-Oxide-Semiconductor Devices
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Chao, Ko-An; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:23Z |
Application of Block Diagonal Technique to a Hamiltonian Matrix in Performing Spin-splitting Calculations for GaN Wurtzite Materials
|
Chen, Chun-Nan; Chang, Sheng-Hsiung; Su, Wei-Long; Wang, Wan-Tsang; Kao, Hsiu-Fen; Jen, Jen-Yi; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:20Z |
Random Interface-Traps-Induced Electrical Characteristic Fluctuation in 16-nm-Gate High-kappa/Metal Gate Complementary Metal-Oxide-Semiconductor Device and Inverter Circuit
|
Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:23:16Z |
Random Work-Function-Induced Threshold Voltage Fluctuation in Metal-Gate MOS Devices by Monte Carlo Simulation
|
Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:22:45Z |
Visi - A VTK- and QT-Based Open-Source Project for Scientific Data Visualization
|
Li, Yiming; Chen, Cheng-Kai |
| 國立交通大學 |
2014-12-08T15:22:45Z |
Effects of Random Number Generations on Intelligent Semiconductor Device Model Parameter Extraction
|
Li, Yiming |
| 國立交通大學 |
2014-12-08T15:22:31Z |
Design and Fabrication of Sub-Wavelength Structure on Silicon Nitride for Solar Cells
|
Sahoo, Kartika Chandra; Li, Yiming; Lin, Men-Ku; Chang, Edward Yi; Huang, Jin-Hua |
| 國立交通大學 |
2014-12-08T15:22:31Z |
Effect of Process Variation on 15-nm-Gate Stacked Multichannel Surrounding-Gate Field Effect Transistor
|
Han, Ming-Hung; Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:21:29Z |
k.p WURTZITE HAMILTONIAN AND OPTICAL MATRIX WITH BULK INVERSION ASYMMETRY
|
Chen, Chun-Nan; Su, Wei-Long; Wang, Wan-Tsang; Jen, Jen-Yi; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:21:19Z |
A Unified 3D Device Simulation of Random Dopant, Interface Trap and Work Function Fluctuations on High-kappa/Metal Gate Device
|
Li, Yiming; Cheng, Hui-Wen; Chiu, Yung-Yueh; Yiu, Chun-Yen; Su, Hsin-Wen |
| 國立交通大學 |
2014-12-08T15:20:33Z |
A Unified Parameterization Technique for TFT-LCD Panel Design Optimization
|
Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:20:12Z |
Random Work Function Variation Induced Threshold Voltage Fluctuation in 16-nm Bulk FinFET Devices with High-kappa-Metal-Gate Material
|
Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:20:04Z |
Simulation of Raman Enhancement in SERS-Active Substrates with Au Layer Considering Different Geometry of Nanoparticles
|
Cheng, Hui-Wen; Li, Yiming |
