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"li yiming"

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Showing items 196-205 of 310  (31 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:23:16Z Random Work-Function-Induced Threshold Voltage Fluctuation in Metal-Gate MOS Devices by Monte Carlo Simulation Li, Yiming; Cheng, Hui-Wen
國立交通大學 2014-12-08T15:22:45Z Visi - A VTK- and QT-Based Open-Source Project for Scientific Data Visualization Li, Yiming; Chen, Cheng-Kai
國立交通大學 2014-12-08T15:22:45Z Effects of Random Number Generations on Intelligent Semiconductor Device Model Parameter Extraction Li, Yiming
國立交通大學 2014-12-08T15:22:31Z Design and Fabrication of Sub-Wavelength Structure on Silicon Nitride for Solar Cells Sahoo, Kartika Chandra; Li, Yiming; Lin, Men-Ku; Chang, Edward Yi; Huang, Jin-Hua
國立交通大學 2014-12-08T15:22:31Z Effect of Process Variation on 15-nm-Gate Stacked Multichannel Surrounding-Gate Field Effect Transistor Han, Ming-Hung; Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming
國立交通大學 2014-12-08T15:21:29Z k.p WURTZITE HAMILTONIAN AND OPTICAL MATRIX WITH BULK INVERSION ASYMMETRY Chen, Chun-Nan; Su, Wei-Long; Wang, Wan-Tsang; Jen, Jen-Yi; Li, Yiming
國立交通大學 2014-12-08T15:21:19Z A Unified 3D Device Simulation of Random Dopant, Interface Trap and Work Function Fluctuations on High-kappa/Metal Gate Device Li, Yiming; Cheng, Hui-Wen; Chiu, Yung-Yueh; Yiu, Chun-Yen; Su, Hsin-Wen
國立交通大學 2014-12-08T15:20:33Z A Unified Parameterization Technique for TFT-LCD Panel Design Optimization Huang, Hsuan-Ming; Li, Yiming
國立交通大學 2014-12-08T15:20:12Z Random Work Function Variation Induced Threshold Voltage Fluctuation in 16-nm Bulk FinFET Devices with High-kappa-Metal-Gate Material Cheng, Hui-Wen; Li, Yiming
國立交通大學 2014-12-08T15:20:04Z Simulation of Raman Enhancement in SERS-Active Substrates with Au Layer Considering Different Geometry of Nanoparticles Cheng, Hui-Wen; Li, Yiming

Showing items 196-205 of 310  (31 Page(s) Totally)
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