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Taiwan Academic Institutional Repository >
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"li yiming"
Showing items 271-280 of 310 (31 Page(s) Totally) << < 22 23 24 25 26 27 28 29 30 31 > >> View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:08:33Z |
Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:08:19Z |
Optimal Configuration of Hydrogen-Embrittlement-Fabricated Nanogaps for Surface-Conduction Electron-Emitter Display
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Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:08:18Z |
Electrical characteristics dependence on the channel fin aspect ratio of multi-fin field effect transistors
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Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:08:06Z |
Silicon Nitride Nanopillars and Nanocones Formed by Nickel Nanoclusters and Inductively Coupled Plasma Etching for Solar Cell Application
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Sahoo, Kartika Chandra; Lin, Men-Ku; Chang, Edward-Yi; Tinh, Tran Binh; Li, Yiming; Huang, Jin-Hua |
| 國立交通大學 |
2014-12-08T15:07:41Z |
Field emission property of CNT field emitters in the triode structure with anodic aluminum oxide template
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Cheng, Hui-Wen; Lin, Chen-Chun; Li, Yiming; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:07:40Z |
Comparative Study of Multigate and Multifin Metal-Oxide-Semiconductor Field-Effect Transistor
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Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:07:40Z |
Minimal equivalent circuit extraction for high-speed PCB signal traces analysis
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Kuo, Yi-Ting; Chao, Hsueh-Yung; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:07:40Z |
Discrete-Dopant-Induced Power-Delay Characteristic Fluctuation in 16 nm Complementary Metal-Oxide-Semiconductor with High Dielectric Constant Material
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Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:07:35Z |
Effect of UV illumination on inverted-staggered a-Si : H thin film transistors
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Li, Yiming; Lou, Jen-Chung; Chen, Chung-Le; Hwang, Chih-Hong; Yan, Shuoting |
| 國立交通大學 |
2014-12-08T15:07:27Z |
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung |
Showing items 271-280 of 310 (31 Page(s) Totally) << < 22 23 24 25 26 27 28 29 30 31 > >> View [10|25|50] records per page
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