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"li yiming"
Showing items 56-65 of 310 (31 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:49:39Z |
Electrical characteristic fluctuations in sub-45nm CMOS devices
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Yang, Fu-Liang; Hwang, Jiunn-Ren; Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:29Z |
Nanosized-Metal-Grain-Induced Characteristic Fluctuation in Gate-All-Around Si Nanowire Metal-Oxide-Semiconductor Devices
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Lai, Chun-Ning; Chen, Chien-Yang; Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:29Z |
Electronic Structure Dependence on the Density, Size and Shape of Ge/Si Quantum Dots Array
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Lee, Ming-Yi; Tsai, Yi-Chia; Li, Yiming; Samukawat, Seiji |
| 國立交通大學 |
2017-04-21T06:49:27Z |
On Characteristic Fluctuation of Nonideal Bulk FinFET Devices
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Li, Yiming; Huang, Wen-Tsung |
| 國立交通大學 |
2017-04-21T06:49:26Z |
Prioritization of Key In-Line Process Parameters for Electrical Characteristic Optimization of High-k Metal Gate Bulk FinFET Devices
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Su, Ping-Husn; Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:20Z |
Electrical Characteristic and Power Consumption Fluctuations of Trapezoidal Bulk FinFET Devices and Circuits Induced by Random Line Edge Roughness
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Chen, Chieh-Yang; Huang, Wen-Tsung; Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:11Z |
Automatic generation of passive equivalent circuits for broadband microstrip antennas
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Kuo, Yi-Ting; Chao, Hsueh-Yung (Robert); Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:09Z |
Novel strained CMOS devices with STI stress buffer layers
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Chen, Hung-Ming; Hwang, Jiunn-Ren; Li, Yiming; Yang, Fu-Liang |
| 國立交通大學 |
2017-04-21T06:48:58Z |
Miniband formulation in Ge/Si quantum dot array
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Tsai, Yi-Chia; Lee, Ming-Yi; Li, Yiming; Samukawa, Seiji |
| 國立交通大學 |
2017-04-21T06:48:52Z |
Process Technological Analysis for Dynamic Characteristic Improvement of 16-nm HKMG Bulk FinFET CMOS Circuits
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Su, Ping-Hsun; Li, Yiming |
Showing items 56-65 of 310 (31 Page(s) Totally)
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