| 國立交通大學 |
2016-03-28T00:05:42Z |
The Impact of Fin/Sidewall/Gate Line Edge Roughness on Trapezoidal Bulk FinFET Devices
|
Huang, Wen-Tsung; Li, Yiming |
| 國立交通大學 |
2016-03-28T00:05:42Z |
Impact of Geometry Aspect Ratio on 10-nm Gate-All-Around Silicon-Germanium Nanowire Field Effect Transistors
|
Chao, Pei-Jung; Li, Yiming |
| 國立交通大學 |
2015-12-02T02:59:38Z |
Miniband Calculation of 3-D Nanostructure Array for Solar Cell Applications
|
Lee, Ming-Yi; Li, Yiming; Samukawa, Seiji |
| 國立交通大學 |
2015-12-02T02:59:16Z |
Circuit-Simulation-Based Multi-Objective Evolutionary Algorithm for Design Optimization of a-Si:H TFTs Gate Driver Circuits Under Multilevel Clock Driving
|
Hung, Sheng-Chin; Chiang, Chien-Hsueh; Li, Yiming |
| 國立交通大學 |
2015-12-02T02:59:16Z |
Design, Fabrication and Characterization of Low-Noise and High-Reliability Amorphous Silicon Gate Driver Circuit for Advanced FPD Applications
|
Chiang, Chien-Hsueh; Li, Yiming |
| 國立交通大學 |
2015-12-02T02:59:06Z |
A novel AlGaN/GaN multiple aperture vertical high electron mobility transistor with silicon oxide current blocking layer
|
Shrestha, Niraj Man; Wang, Yuen Yee; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2015-11-26T01:05:56Z |
以幾何規劃方式求解矽鍺異質接面雙極性電晶體摻雜輪廓最佳化之研究
|
陳英傑; Chen, Ying-Chieh; 李義明; Li, Yiming |
| 國立交通大學 |
2015-11-26T01:05:53Z |
隨機金屬閘極功函數導致之16奈米金氧半場效應電晶體元件及電路特性擾動之研究
|
韓銘鴻; Han, Ming-Hung; 李義明; Li, Yiming |
| 國立交通大學 |
2015-11-26T01:05:52Z |
16奈米場效應電晶體特性擾動抑制暨TFT-LCD驅動電路設計優化之研究
|
李國輔; Lee, Kuo-Fu; 李義明; Li, Yiming |
| 國立交通大學 |
2015-11-26T00:55:22Z |
本質參數擾動對於低操作電壓塊材鰭式場效應電晶體元件特性與電路功率消耗變異之研究
|
許勝嘉; Hsu, Sheng-Chia; 李義明; Li, Yiming |
| 國立交通大學 |
2015-07-21T11:20:49Z |
Electrical characteristic fluctuation of 16-nm-gate high-kappa/metal gate bulk FinFET devices in the presence of random interface traps
|
Hsu, Sheng-Chia; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:31:31Z |
On Characteristic Variability of 16-nm-Gate Bulk FinFET Devices Induced by Intrinsic Parameter Fluctuation and Process Variation Effect
|
Chen, Chieh-Yang; Li, Yiming; Chen, Yu-Yu; Chang, Han-Tung; Hsu, Sheng-Chia; Huang, Wen-Tsung; Yang, Chin-Min; Chen, Li-Wen |
| 國立交通大學 |
2015-07-21T08:31:29Z |
Statistical Device Simulation of Intrinsic Parameter Fluctuation in 16-nm-Gate N- and P-type Bulk FinFETs
|
Chen, Yu-Yu; Huang, Wen-Tsung; Hsu, Sheng-Chia; Chang, Han-Tung; Chen, Chieh-Yang; Yang, Chin-Min; Chen, Li-Wen; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:31:18Z |
Numerical Simulation of Field Enhancement Property of Surface Enhanced Raman Spectroscopy Active Substrates
|
Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:31:14Z |
Device Simulation of P-InAlN-Gate AlGaN/GaN High Electron Mobility Transistor
|
Shrestha, Niraj Man; Lin, Yueh-Chin; Chang, Han-Tung; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2015-07-21T08:31:14Z |
Design Optimization of 16-nm Bulk FinFET Technology via Geometric Programming
|
Su, Ping-Hsun; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:29:54Z |
Source/Drain Series Resistance Extraction in HKMG Multifin Bulk FinFET Devices
|
Su, Ping-Hsun; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:29:33Z |
Determination of Source-and-Drain Series Resistance in 16-nm-Gate FinFET Devices
|
Su, Ping-Hsun; Li, Yiming |
| 國立交通大學 |
2015-07-21T08:29:23Z |
Capacitance Characteristic Optimization of Germanium MOSFETs with Aluminum Oxide by Using a Semiconductor-Device-Simulation-Based Multi-Objective Evolutionary Algorithm Method
|
Li, Yiming; Chen, Chieh-Yang |
| 國立交通大學 |
2015-07-21T08:29:13Z |
Random-work-function-induced characteristic fluctuation in 16-nm-gate bulk and SOI FinFETs
|
Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu |
| 國立交通大學 |
2015-07-21T08:28:16Z |
Upper/lower-side random dopant fluctuation on 16-nm-gate HKMG bulk FinFET
|
Li, Yiming; Huang, Wen-Tsung; Chen, Chieh-Yang; Chen, Yu-Yu |
| 國立交通大學 |
2014-12-13T10:51:04Z |
16奈米矽多重閘極電晶體中隨機摻雜導致之特性擾動及其抑制方法
|
李義明; LI YIMING |
| 國立交通大學 |
2014-12-13T10:47:42Z |
16奈米矽多重閘極電晶體中隨機摻雜導致之特性擾動及其抑制方法
|
李義明; LI YIMING |
| 國立交通大學 |
2014-12-13T10:30:44Z |
系統晶片之靜電防護元件模擬、電路模型與參數最佳化之研究(II)
|
李義明; LI YIMING |
| 國立交通大學 |
2014-12-13T10:29:23Z |
系統晶片之靜電防護元件模擬、電路模型與參數最佳化之研究(III)
|
李義明; LI YIMING |
| 國立交通大學 |
2014-12-13T10:28:31Z |
隨機摻雜在次20奈米矽場效應電晶體特性擾動之研究
|
李義明; LI YIMING |
| 國立交通大學 |
2014-12-12T02:44:57Z |
具梯形通道塊材鰭式場效應電晶體元件及其電路特性擾動之研究
|
黃文聰; Huang, Wen-Tsung; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T02:38:26Z |
離散摻雜位置效應以及隨機金屬晶粒在塊材鰭式場效應電晶體特性影響之研究
|
陳昱宇; Chen, Yu-Yu; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T02:37:27Z |
以多目標演化技術實現矽薄膜太陽能電池結構設計最佳化之研究
|
陳頡陽; Chen, Chieh-Yang; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T02:31:23Z |
具立體通道之矽奈米級金氧半場效應電晶體本質參數擾動之研究
|
黃至鴻; Hwang, Chih-Hong; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:57:38Z |
內部參數擾動在金屬閘高介電鰭式場效應電晶體特性影響之3D元件模擬研究
|
蘇信文; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:47:34Z |
隨機缺陷在16奈米金屬閘高介電場效應電晶體特性影響之研究
|
余俊諺; Yiu, Chun-Yen; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:47:33Z |
混合式多目標演化計算與幾何規劃在資通面板電路與布局之研究
|
羅翊修; Lo, I-Hsiu; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:43:30Z |
一個階層式行動網路下的代理式快速換手機制
|
黃紀寰; Huang, Chi-Huan; 陳耀宗; 李義明; Chen, Yaw-Chung; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:38:35Z |
電晶體等效電路模型參數萃取之研究
|
曾毓翔; Tseng, Yu-Hsiang; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:28:15Z |
奈米級靜態隨機存取記憶體之特性擾動及其壓抑技術
|
李典燁; Li, Tien-Yeh; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:26:15Z |
多世代LCD TV市場動態成長分析與預測之研究
|
李冠樺; Lee, Guan-Hua; 蔡璧徽; 李義明; Tsai, Bi-Huei; Li, Yiming |
| 國立交通大學 |
2014-12-12T01:25:41Z |
系統動態觀點之高科技產品擴散,替代與競爭模型之研究
|
江素雲; Chiang, Su-Yun; 虞孝成; 李義明; Yu, Hsiao-Cheng; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:49:15Z |
Novel surface conduction electron emitter (SCE) nanogaps for field emission displays
|
Tsai, Chih-Hao; Pan, Fu-Ming; Lo, Hsiang-Yu; Li, Yiming; Kuo, Yi-Ting; Chao, Hsueh-Yung (Robert); Lo, Kuo-Chung; Jiang, Mei-Tsao; Mo, Chi-Neng |
| 國立交通大學 |
2014-12-08T15:48:26Z |
Fabrication and Configuration Development of Silicon Nitride Sub-Wavelength Structures for Solar Cell Application
|
Sahoo, Kartika Chandra; Chang, Edward Yi; Li, Yiming; Lin, Men-Ku; Huang, Jin-Hua |
| 國立交通大學 |
2014-12-08T15:48:22Z |
Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants
|
Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:48:10Z |
Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications
|
Lee, Huang-Ming; Sahoo, Kartika Chandra; Li, Yiming; Wu, Jong-Ching; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:48:09Z |
Shape Effect of Silicon Nitride Subwavelength Structure on Reflectance for Silicon Solar Cells
|
Sahoo, Kartika Chandra; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:48:09Z |
Novel Metamorphic HEMTs With Highly Doped InGaAs Source/Drain Regions for High Frequency Applications
|
Sahoo, Kartika Chandra; Kuo, Chien-I; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:47:47Z |
Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory
|
Li, Yiming; Cheng, Hui-Wen; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:44:21Z |
Field emission property of carbon nanotube field emitters in triode structure fabricated with anodic aluminum oxide templates
|
Li, Yiming; Cheng, Hui-Wen; Lin, Chen-Chun; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:43:50Z |
Analysis of field emission of fabricated nanogap in Pd strips for surface conduction electron-emitter displays
|
Lo, Hsiang-Yu; Li, Yiming; Tsai, Chih-Hao; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Interface traps and random dopants induced characteristic fluctuations in emerging MOSFETs
|
Li, Yiming; Cheng, Hui-Wen; Chiu, Yung-Yueh |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Discrete-dopant-fluctuated threshold voltage roll-off in sub-16 nm bulk fin-type field effect transistors
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:43:38Z |
Nanosized metal grains induced electrical characteristic fluctuation in 16-nm-gate high-kappa/metal gate bulk FinFET devices
|
Li, Yiming; Cheng, Hui-Wen; Yiu, Chun-Yen; Su, Hsin-Wen |
