| 國立交通大學 |
2014-12-08T15:48:22Z |
Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants
|
Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:48:10Z |
Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications
|
Lee, Huang-Ming; Sahoo, Kartika Chandra; Li, Yiming; Wu, Jong-Ching; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:48:09Z |
Shape Effect of Silicon Nitride Subwavelength Structure on Reflectance for Silicon Solar Cells
|
Sahoo, Kartika Chandra; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:48:09Z |
Novel Metamorphic HEMTs With Highly Doped InGaAs Source/Drain Regions for High Frequency Applications
|
Sahoo, Kartika Chandra; Kuo, Chien-I; Li, Yiming; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:47:47Z |
Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory
|
Li, Yiming; Cheng, Hui-Wen; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:44:21Z |
Field emission property of carbon nanotube field emitters in triode structure fabricated with anodic aluminum oxide templates
|
Li, Yiming; Cheng, Hui-Wen; Lin, Chen-Chun; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:43:50Z |
Analysis of field emission of fabricated nanogap in Pd strips for surface conduction electron-emitter displays
|
Lo, Hsiang-Yu; Li, Yiming; Tsai, Chih-Hao; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Interface traps and random dopants induced characteristic fluctuations in emerging MOSFETs
|
Li, Yiming; Cheng, Hui-Wen; Chiu, Yung-Yueh |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Discrete-dopant-fluctuated threshold voltage roll-off in sub-16 nm bulk fin-type field effect transistors
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:43:38Z |
Nanosized metal grains induced electrical characteristic fluctuation in 16-nm-gate high-kappa/metal gate bulk FinFET devices
|
Li, Yiming; Cheng, Hui-Wen; Yiu, Chun-Yen; Su, Hsin-Wen |
| 國立交通大學 |
2014-12-08T15:43:31Z |
Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors
|
Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:43:15Z |
Numerical simulation of field emission efficiency of anodic aluminum oxide carbon nanotube field emitter in the triode structure
|
Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Design optimization of a current mirror amplifier integrated circuit using a computational statistics technique
|
Li, Yiming; Li, Yih-Lang; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:42:06Z |
Electronic design automation using a unified optimization framework
|
Li, Yiming; Yu, Shao-Ming; Li, Yih-Lang |
| 國立交通大學 |
2014-12-08T15:41:46Z |
Enhancement of Field Emission on Surface Conduction Electron-Emitters
|
Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:40:40Z |
Discrete-Dopant-Fluctuated Transient Behavior and Variability Suppression in 16-nm-Gate Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
|
Li, Yiming; Hwang, Chih-Hong; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:40:28Z |
Field Emission Stability of Anodic Aluminum Oxide Carbon Nanotube Field Emitter in the Triode Structure
|
Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:40:27Z |
Emission Efficiency Dependence on the Width and Thickness of Nanogaps in Surface-Conduction Electron-Emitter Displays
|
Li, Yiming; Lo, Hsiang-Yu |
| 國立交通大學 |
2014-12-08T15:39:18Z |
3D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate Devices
|
Cheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:38:10Z |
Quantum hydrodynamic simulation of discrete-dopant fluctuated physical quantities in nanoscale FinFET
|
Li, Yiming; Cheng, Hui-Wen; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:38:09Z |
Investigation of Raman enhancement in hydrothermally roughened SERS-active substrates
|
Cheng, Hui-Wen; Li, Yiming; Yang, Jung-Yen |
| 國立交通大學 |
2014-12-08T15:37:49Z |
Hybrid Differential Evolution and Particle Swarm Optimization Approach to Surface-Potential-Based Model Parameter Extraction for Nanoscale MOSFETs
|
Li, Yiming; Tseng, Yu-Hsiang |
| 國立交通大學 |
2014-12-08T15:37:09Z |
A compact model for electrostatic discharge protection nanoelectronics simulation
|
Chou, Hung-Mu; Yu, Shao-Ming; Lee, Jam-Wem; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:36:36Z |
A simulation-based evolutionary technique for inverse doping profile problem of sub-65 nm CMOS devices
|
Li, Yiming; Chen, Cheng-Kai |
| 國立交通大學 |
2014-12-08T15:36:36Z |
Numerical simulation and comparison of electrical characteristics between uniaxial strained bulk and SOI FinFETs
|
Li, Yiming |
