| 國立交通大學 |
2014-12-08T15:28:22Z |
High field emission efficiency surface conduction electron emitters
|
Li, Yiming; Chao, Hsueh-Yung; Lo, Hsiang-Yu |
| 國立交通大學 |
2014-12-08T15:25:39Z |
Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits
|
Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung; Lee, Kuo-Fu; Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:25:38Z |
Reflectance of Sub-Wavelength Structure on Silicon Nitride for Solar Cell Application
|
Sahoo, Kartika Chandra; Li, Yiming; Chang, Edward Yi; Lin, Men-Ku; Huang, Jin-Hua |
| 國立交通大學 |
2014-12-08T15:25:32Z |
Monotone iterative method for numerical solution of nonlinear ODEs in MOSFET RF circuit simulation
|
Li, Yiming; Yu, Shao-Ming; Wang, Chuan-Sheng |
| 國立交通大學 |
2014-12-08T15:25:28Z |
Hybrid evolutionary approach to optimal design of CMOS LNA integrated circuits
|
Li, Yiming; Chou, Hung-Mu |
| 國立交通大學 |
2014-12-08T15:25:27Z |
2005 international symposium of computational electronics: Physical modeling, mathematical theory, and numerical algorithm
|
Li, Yiming |
| 國立交通大學 |
2014-12-08T15:25:08Z |
Parallel numerical solution to large-scale eigenvalue problem in master equation of protein folding kinetics
|
Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:25:02Z |
Electron energy state spin splitting in nanoscale InAs/GaAs semiconductor quantum rings
|
Li, Yiming |
| 國立交通大學 |
2014-12-08T15:25:01Z |
International symposium on computational electronics and selected topics
|
Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:58Z |
A unified optimization framework for microelectronics industry
|
Li, Yiming; Chen, Cheng-Kai; Cho, Yen-Yu |
| 國立交通大學 |
2014-12-08T15:24:49Z |
Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:48Z |
Propagation Delay Dependence on Channel Fins and Geometry Aspect Ratio of 16-nm Multi-Gate MOSFET Inverter
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:46Z |
Evaluation of account receivable collection alternatives with fuzzy MCDM methodology
|
Hung, Chih-Young; Li, Yiming; Chiang, Yi-Hui |
| 國立交通大學 |
2014-12-08T15:24:43Z |
A unified optimization framework for real world problems
|
Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:24:38Z |
A distributed simulation-based computational intelligence algorithm for nanoscale semiconductor device inverse problem
|
Li, Yiming; Chen, Cheng-Kai |
| 國立交通大學 |
2014-12-08T15:24:27Z |
Threshold Voltage Fluctuation in 16-nm-Gate FinFETs Induced by Random Work Function of Nanosized Metal Grain
|
Li, Yiming; Cheng, Hui-Wen; Hwang, Chi-Hong |
| 國立交通大學 |
2014-12-08T15:24:19Z |
Modeling of Price Effects for the Adoption of LCD TV
|
Tsai, Bi-Huei; Li, Yiming; Lee, Guan-Hua |
| 國立交通大學 |
2014-12-08T15:24:17Z |
Velocity-direction dependent transmission coefficient of electron through potential barrier grown on anisotropic semiconductor
|
Chen, Chun-Nan; Chang, Sheng-Hsiung; Su, Wei-Long; Jen, Jen-Yi; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Parameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD Panel
|
Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:03Z |
Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Characteristics Variability of Novel Lateral Asymmetry Nano-MOSFETs due to Random Discrete Dopant
|
Lee, Kou-Fu; Hwang, Chih-Hong; Li, Tien-Yeh; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:44Z |
Effect of Flash Lamp Annealing and Laser Spike Annealing on Random Dopant Fluctuation of 15-nm Metal-Oxide-Semiconductor Devices
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Chao, Ko-An; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:23Z |
Application of Block Diagonal Technique to a Hamiltonian Matrix in Performing Spin-splitting Calculations for GaN Wurtzite Materials
|
Chen, Chun-Nan; Chang, Sheng-Hsiung; Su, Wei-Long; Wang, Wan-Tsang; Kao, Hsiu-Fen; Jen, Jen-Yi; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:20Z |
Random Interface-Traps-Induced Electrical Characteristic Fluctuation in 16-nm-Gate High-kappa/Metal Gate Complementary Metal-Oxide-Semiconductor Device and Inverter Circuit
|
Li, Yiming; Cheng, Hui-Wen |
