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Taiwan Academic Institutional Repository >
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"li yiming"
Showing items 221-230 of 310 (31 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:15:51Z |
Comparison of random-dopant-induced threshold voltage fluctuation in nanoscale single-, double-, and surrounding-gate field-effect transistors
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Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:15:13Z |
Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
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Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:14:47Z |
A floating gate design for electrostatic discharge protection circuits
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Chou, Hung-Mu; Lee, Jam-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:14:30Z |
An efficient near-ML algorithm with SQRD for wireless MIMO communications in metro transportation systems
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Pan, Chien-Hung; Lee, Ta-Sung; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:14:15Z |
Optimization on configuration of surface conduction electron-emitters
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Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:13:32Z |
The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit
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Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:13:31Z |
Effect of Process Variation on Field Emission Characteristic in Surface Conduction Electron-Emitters
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Lo, Hsiang-Yu; Li, Yiming; Chao, Hsueh-Yung; Tsai, Chih-Hao; Pan, Fu-Ming |
| 國立交通大學 |
2014-12-08T15:13:30Z |
Discrete Dopant Induced Electrical and Thermal Fluctuation in Nanoscale SOI FinFET
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:13:29Z |
Effect of Single Grain Boundary Position on Surrounding-Gate Polysilicon Thin Film Transistors
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Li, Yiming; Huang, Jung Y.; Lee, Bo-Shian; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:13:15Z |
Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell
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Lee, Kuo-Fu; Li, Yiming; Li, Tien-Yen; Su, Zhong-Cheng; Hwang, Chin-Hong |
Showing items 221-230 of 310 (31 Page(s) Totally)
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