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Showing items 286-295 of 310 (31 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:07:07Z |
Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants
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Lee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:07:06Z |
Numerical simulation of static noise margin for a six-transistor static random access memory cell with 32nm fin-typed field effect transistors
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:06:56Z |
Forecasting global adoption of crystal display televisions with modified product diffusion model
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Tsai, Bi-Huei; Li, Yiming; Lee, Guan-Hua |
| 國立交通大學 |
2014-12-08T15:06:44Z |
An optimal silicidation technique for electrostatic discharge protection sub-100 nm CMOS devices in VLSI circuit
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Yu, Shao-Ming; Lee, Jam-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:06:38Z |
An automatic parameter extraction technique for advanced CMOS device modeling using genetic algorithm
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Li, Yiming |
| 國立交通大學 |
2014-12-08T15:05:52Z |
Analytical solution of nonlinear Poisson equation for symmetric double-gate metal-oxide-semiconductor field effect transistors
|
Lo, Shih-Ching; Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:05:34Z |
Process-variation- and random-dopants-induced threshold voltage fluctuations in nanoscale CMOS and SOI devices
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Li, Yiming; Yu, Shao-Ming; Chen, Hung-Ming |
| 國立交通大學 |
2014-12-08T15:05:19Z |
A coupled-simulation-and-optimization approach to nanodevice fabrication with minimization of electrical characteristics fluctuation
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Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:03:52Z |
A Symbiosis Model for New Product Development through Open Innovation Process
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Yang, Chia-Han; Shyu, Joseph Z.; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:03:51Z |
A Dynamic Competition Analysis on the Personal Computer Shipments in Taiwan Using Lotka-Volterra Model
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Chiang, Su-Yun; Wong, Gwo-Gauang; Li, Yiming; Yu, Hsiao-Cheng |
Showing items 286-295 of 310 (31 Page(s) Totally)
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