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Showing items 1-10 of 182  (19 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2022-09-21T23:30:14Z Accuracy-enhanced diffraction image profilometry using foreign aberration for resolving image ambiguity Wu, Guo Wei; LIANG-CHIA CHEN
臺大學術典藏 2022-09-21T23:30:14Z New critical dimension optical metrology for submicron high-aspect-ratio structures using spectral reflectometry with supercontinuum laser illumination Chein, Wei Hsin; Yang, Fu Sheng; Thakur, Komal; Wu, Guo Wei; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:28:45Z Precise 3-D microscopic profilometry using diffractive image microscopy and artificial neural network in single-exposure manner Wu G.-W;Chen L.-C.; Wu G.-W; Chen L.-C.; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:28:45Z Precise 3-D microscopic profilometry using diffractive image microscopy and artificial neural network in single-exposure manner Wu G.-W;Chen L.-C.; Wu G.-W; Chen L.-C.; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:28:45Z High-speed chromatic confocal microscopy using multispectral sensors for sub-micrometer-precision microscopic surface profilometry Chen L.-C;Tan P.-J;Wu G.-W;Lin C.-J;Nguyen D.T.; Chen L.-C; Tan P.-J; Wu G.-W; Lin C.-J; Nguyen D.T.; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:28:45Z High-speed chromatic confocal microscopy using multispectral sensors for sub-micrometer-precision microscopic surface profilometry Chen L.-C;Tan P.-J;Wu G.-W;Lin C.-J;Nguyen D.T.; Chen L.-C; Tan P.-J; Wu G.-W; Lin C.-J; Nguyen D.T.; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:25:58Z High-speed chromatic confocal microscopy using multispectral sensors for sub-micrometer-precision microscopic surface profilometry Chen L.-C;Tan P.-J;Wu G.-W;Lin C.-J;Nguyen D.T.; Chen L.-C; Tan P.-J; Wu G.-W; Lin C.-J; Nguyen D.T.; LIANG-CHIA CHEN
臺大學術典藏 2022-03-22T08:25:57Z Precise 3-D microscopic profilometry using diffractive image microscopy and artificial neural network in single-exposure manner Wu G.-W;Chen L.-C.; Wu G.-W; Chen L.-C.; LIANG-CHIA CHEN
臺大學術典藏 2022-01-22T00:03:59Z High-speed chromatic confocal microscopy using multispectral sensors for sub-micrometer-precision microscopic surface profilometry LIANG-CHIA CHEN; Tan, Pei Ju; Wu, Guo Wei; Lin, Chih Jer; Nguyen, Duc Trung
臺大學術典藏 2021-10-14T01:16:14Z 3-D Full-field Surface Profilometry Using Synthesis of Random-Speckle and Structured-Fringe Projection for Automated Optical Inspection (AOI Liang-Chia Chen; Chung-An Hsieh; Thanh-Hung Nguyen; LIANG-CHIA CHEN

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