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"liang m s"
Showing items 6-15 of 38 (4 Page(s) Totally)
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| 臺大學術典藏 |
2020-01-06T03:08:08Z |
Biodegradation of n-alkanes at high concentration and correlation to the accumulation of H + ions in Rhodococcus erythropolis NTU-1
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Liu, C.-W.; Liang, M.-S.; Chen, Y.-C.; Sayavedra-Soto, L.A.; Liu, H.-S.; HWAI-SHEN LIU |
| 臺大學術典藏 |
2019-03-11T08:01:04Z |
The dependence of the performance of strained NMOSFETs on channel width
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Liang, M.S.;Lee, T.L.;Liu, C.W.;Lee, J.Y.-M.;Wu, J.;Chen, C.H.;Yeh, L.;Liao, M.H.; Yeh, L.; Liao, M.H.; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; Liang, M.S. |
| 臺大學術典藏 |
2019-03-11T08:01:01Z |
Superior n-MOSFET performance by optimal stress design
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Liang, M.-S.;Liu, C.W.;Lee, T.-L.;Yeh, L.;Liao, M.H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liang, M.-S. |
| 臺大學術典藏 |
2018-09-10T08:14:39Z |
Data compression and query for large scale sensor data on COTS DBMS
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Shih, C.-S.; Liang, M.-S.; CHI-SHENG SHIH; Suei, P.-L.;Kuo, C.-W.;Luoh, R.-S.;Kuo, T.-W.;Shih, C.-S.;Liang, M.-S.; Suei, P.-L.; Kuo, C.-W.; Luoh, R.-S.; Kuo, T.-W. |
| 臺大學術典藏 |
2018-09-10T07:37:16Z |
The dependence of the performance of strained NMOSFETs on channel width
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Yeh, L.;Liao, M.H.;Chen, C.H.;Wu, J.;Lee, J.Y.-M.;Liu, C.W.;Lee, T.L.;Liang, M.S.; Yeh, L.; Liao, M.H.; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; Liang, M.S.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
Digital communication using Ge metal-insulator-semiconductor light-emitting diodes and photodetectors
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Cheng, T.-H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:10Z |
Gate width dependence on backscattering characteristics in the nanoscale strained complementary metal-oxide-semiconductor field-effect transistor
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Liao, M.H.; Liu, C.W.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:08Z |
Superior n-MOSFET performance by optimal stress design
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Liao, M.H.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liang, M.-S.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T06:31:20Z |
Superior n-MOSFET performance by optimal stress design
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CHEE-WEE LIU; Liang, M.-S.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liao, M.H.; Yang, Y.-J. |
| 國立交通大學 |
2017-04-21T06:48:24Z |
High temperature stable [Ir3Si-TaN]/HfLaON CMOS with large work-function difference
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Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Chen, W. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S. |
Showing items 6-15 of 38 (4 Page(s) Totally)
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