|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"liang ms"
Showing items 16-25 of 56 (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:43:48Z |
Leakage mechanism in Cu damascene structure with methylsilane-doped low-K CVD oxide as intermetal dielectric
|
Wu, ZC; Chiang, CC; Wu, WH; Chen, MC; Jeng, SM; Li, LJ; Jang, SM; Yu, CH; Liang, MS |
| 國立交通大學 |
2014-12-08T15:43:48Z |
Physical and electrical characteristics of methylsilane- and trimethylsilane-doped low dielectric constant chemical vapor deposited oxides
|
Wu, ZC; Shiung, ZW; Chiang, CC; Wu, WH; Chen, MC; Jeng, SM; Chang, W; Chou, PF; Jang, SM; Yu, CH; Liang, MS |
| 國立交通大學 |
2014-12-08T15:43:46Z |
Characterization and modeling of edge direct tunneling (EDT) leakage in ultrathin gate oxide MOSFETs
|
Yang, KN; Huang, HT; Chen, MJ; Lin, YM; Yu, MC; Jang, SM; Yu, DCH; Liang, MS |
| 國立交通大學 |
2014-12-08T15:43:46Z |
A trap generation closed-form statistical model for intrinsic oxide breakdown
|
Huang, HT; Chen, MJ; Su, CW; Chen, JH; Hou, CS; Liang, MS |
| 國立交通大學 |
2014-12-08T15:43:09Z |
Edge hole direct Tunneling leakage in ultrathin gate oxide p-channel MOSFETs
|
Yang, KN; Huang, HT; Chen, MJ; Lin, YM; Yu, MC; Jang, SSM; Yu, DCH; Liang, MS |
| 國立交通大學 |
2014-12-08T15:43:09Z |
Generalized interconnect delay time and crosstalk models: I. Applications of interconnect optimization design
|
Lee, TGY; Tseng, TY; Wong, SC; Yang, CJ; Liang, MS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:43:09Z |
Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models
|
Lee, TGY; Tseng, TY; Wong, SC; Yang, CJ; Liang, MS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Implantation induced defects in the retrograde well with a buried layer
|
Hsu, WC; Liang, MS; Chen, MC |
| 國立交通大學 |
2014-12-08T15:42:27Z |
Post-implantation thermal annealing effect on the gate oxide of triple-well-structure
|
Hsu, WC; Liang, MS; Lin, CT; Chen, MC |
| 國立交通大學 |
2014-12-08T15:41:51Z |
A physical model for the hysteresis phenomenon of the ultrathin ZrO2 film
|
Wang, JC; Chiao, SH; Lee, CL; Lei, TF; Lin, YM; Wang, MF; Chen, SC; Yu, CH; Liang, MS |
Showing items 16-25 of 56 (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page
|
