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机构 日期 题名 作者
國立交通大學 2014-12-08T15:16:11Z Study of void formation due to electromigration in flip-chip solder joints using Kelvin bump probes Chang, Y. W.; Liang, S. W.; Chen, Chih
國立交通大學 2014-12-08T15:16:08Z Geometrical effect of bump resistance for flip-clip solder joints: Finite-element modeling and experimental results Liang, S. W.; Chang, Y. W.; Chen, Chih; Liu, Y. C.; Chen, K. H.; Lin, S. H.
國立交通大學 2014-12-08T15:14:47Z Three-dimensional thermoelectrical simulation in flip-chip solder joints with thick underbump metallizations during accelerated electromigration testing Liang, S. W.; Chang, Y. W.; Chen, Chih
國立交通大學 2014-12-08T15:14:40Z Effect of Al-trace degradation on Joule heating during electromigration in flip-chip solder joints Liang, S. W.; Chiu, S. H.; Chen, Chih
國立交通大學 2014-12-08T15:14:37Z Electromigration issues in lead-free solder joints Chen, Chih; Liang, S. W.
國立交通大學 2014-12-08T15:13:17Z Relieving hot-spot temperature during electromigration in solder and current crowding effects bumps by using Cu columns Liang, S. W.; Chang, Y. W.; Chen, Chih
國立交通大學 2014-12-08T15:11:14Z Effect of migration and condensation of pre-existing voids on increase in bump resistance of flip chips on flexible substrates during electromigration Liang, S. W.; Chang, Y. W.; Chen, Chih; Preciado, Jackie; Tu, K. N.
國立交通大學 2014-12-08T15:11:08Z Direct measurement of hot-spot temperature in flip-chip solder joints under current stressing using infrared microscopy Hsiao, Hsiang-Yao; Liang, S. W.; Ku, Min-Feng; Chen, Chih; Yao, Da-Jeng
國立交通大學 2014-12-08T15:09:31Z Effect of bump size on current density and temperature distributions in flip-chip solder joints Kuan, Wei-Chih; Liang, S. W.; Chen, Chih
國立交通大學 2014-12-08T15:08:08Z Nonuniform and Negative Marker Displacements Induced by Current Crowding During Electromigration in Flip-Chip Sn-0.7Cu Solder Joints Liang, S. W.; Hsiao, Hsiang-Yao; Chen, Chih; Xu, Luhua; Tu, K. N.; Lai, Yi-Shao

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