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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T08:34:38Z	Annealing-induced changes in the nanoscale electrical homogeneity of bismuth ferrite dielectric thin films	Liang, Y.-C. and Chen, W.S. and Hu, C.-Y. and Huang, C.-L. and Kai, W.; WEN-SHIANG CHEN

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