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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2017-04-21T06:55:20Z |
High-permitivity cerium oxide prepared by molecular beam deposition as gate dielectric and passivation layer and applied to AlGaN/GaN power high electron mobility transistor devices
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Chiu, Yu Sheng; Liao, Jen Ting; Lin, Yueh Chin; Liu, Shin Chien; Lin, Tai Ming; Iwai, Hiroshi; Kakushima, Kuniyuki; Chang, Edward Yi |
國立交通大學 |
2015-12-02T02:59:28Z |
Effect of high voltage stress on the DC performance of the Al2O3/AlN GaN metal-insulator-semiconductor high-electron mobility transistor for power applications
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Hsieh, Ting-En; Lin, Yueh-Chin; Liao, Jen-Ting; Lan, Wei-Cheng; Chin, Ping-Chieh; Chang, Edward Yi |
國立交通大學 |
2014-12-12T02:39:40Z |
藉由高介電質材料做表面鈍化及閘極絕緣層改善氮化鋁鎵/氮化鎵之高電子遷移率電晶體元件特性
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廖仁廷; Liao, Jen-Ting; 張翼; 林萬里 |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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