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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"liao m y"的相關文件
顯示項目 36-45 / 58 (共6頁)
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| 國立臺灣科技大學 |
2012 |
Generalized inference for measuring process yield with the contamination of measurement errors-quality control for silicon wafer manufacturing processes in the semiconductor industry
|
Wu, C.-W.;Liao, M.-Y. |
| 國立臺灣科技大學 |
2012 |
An improved approach for constructing lower confidence bound on process yield
|
Wu, C.-W.;Liao, M.-Y.;Chen, J.C. |
| 臺大學術典藏 |
2012 |
Epithelial cell adhesion molecule regulates tumor initiation and tumorigenesis via activating reprogramming factors and epithelial-mesenchymal transition gene expression in colon cancer
|
Lin, C.-W.;Liao, M.-Y.;Lin, W.-W.;Wang, Y.-P.;Lu, T.-Y.;Wu, H.-C.; YI-PING WANG |
| 國立臺灣科技大學 |
2011 |
Two Tests for Supplier Selection Based on Process Yield
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Pearn, W.L.;Liao, M.Y.;Wu, C.W.;Chu, Y.T. |
| 國立臺灣科技大學 |
2010 |
Evaluating process performance based on the incapability index for measurements with uncertainty
|
Liao, M. Y. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
An alternative approach to controlling tool wear problem with an application to grinding wheels management in manufacturing silicon wafers
|
Liao, M. Y. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
Process performance evaluation with imprecise information
|
Wu, Chien-Wei; Liao, M. Y. ; Shu, M. H. |
| 國立臺灣科技大學 |
2010 |
Capability testing based on subsamples: a case on photolithography process control in wafer fabrication
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Liao, M. Y. ; Kang, H. Y. ; Lee, A. H. I. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
Measuring process yield by fuzzy lower confidence bounds
|
Wu, Chien-Wei; Liao, M. Y. |
| 國立臺灣科技大學 |
2010 |
Bootstrap methods for process performance evaluation
|
Liao, M. Y. ; Wu, Chien-Wei; Yang, C. H. |
顯示項目 36-45 / 58 (共6頁)
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