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Showing items 1-8 of 8 (1 Page(s) Totally)
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| 國立成功大學 |
2014-12 |
Variation-Aware Comparative Study of 10-nm GAA Versus FinFET 6-T SRAM Performance and Yield
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Zheng, Peng; Liao, Yi-Bo; Damrongplasit, Nattapol; Chiang, Meng-Hsueh; Liu, Tsu-Jae King |
| 國立成功大學 |
2014-08 |
Investigation of Temperature-Dependent Characteristics of AlGaN/GaN MOS-HEMT by Using Hydrogen Peroxide Oxidation Technique
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Liu, Han-Yin; Hsu, Wei-Chou; Lee, Ching-Sung; Chou, Bo-Yi; Liao, Yi-Bo; Chiang, Meng-Hsueh |
| 國立成功大學 |
2014-07-16 |
高密度之全包覆式閘極電晶體設計
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廖翊博; Liao, Yi-Bo |
| 國立成功大學 |
2014-07 |
Design of Gate-All-Around Silicon MOSFETs for 6-T SRAM Area Efficiency and Yield
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Liao, Yi-Bo; Chiang, Meng-Hsueh; Damrongplasit, Nattapol; Hsu, Wei-Chou; Liu, Tsu-Jae King |
| 國立成功大學 |
2014-06-26 |
高密度之全包覆式閘極電晶體設計
|
廖翊博; Liao, Yi-Bo |
| 國立成功大學 |
2014-04 |
Stack Gate Technique for Dopingless Bulk FinFETs
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Liao, Yi-Bo; Chiang, Meng-Hsueh; Lai, Yu-Sheng; Hsu, Wei-Chou |
| 國立成功大學 |
2013-07 |
A pragmatic design methodology using proper isolation and doping for bulk FinFETs
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Liao, Yi-Bo; Chiang, Meng-Hsueh; Lai, Yu-Sheng; Hsu, Wei-Chou |
| 國立成功大學 |
2012-05 |
Assessment of structure variation in silicon nanowire FETs and impact on SRAM
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Liao, Yi-Bo; Chiang, Meng-Hsueh; Kim, Keunwoo; Hsu, Wei-Chou |
Showing items 1-8 of 8 (1 Page(s) Totally)
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