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| 國立交通大學 |
2016-03-28T00:04:19Z |
Positive gate bias instability alleviated by self-passivation effect in amorphous InGaZnO thin-film transistors
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Li, GongTan; Yang, Bo-Ru; Liu, Chuan; Lee, Chia-Yu; Tseng, Chih-Yuan; Lo, Chang-Cheng; Lien, Alan; Deng, ShaoZhi; Shieh, Han-Ping D.; Xu, NingSheng |
| 國立成功大學 |
2014-12-01 |
Anomalous degradation behaviors under illuminated gate bias stress in a-Si:H thin film transistor
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Lin, Kun-Yao; Wu, Yi-Chun; Huang, Shih-Feng; Chiang, Cheng-Lung; Chen, Po-Lin; Lai, Tzu-Chieh; Lo, Chang-Cheng; Lien, Alan |
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