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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T05:59:32Z |
An extraction method to determine interconnect parasitic parameters
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Chao, CJ; Wong, SC; Chen, MJ; Liew, BK |
| 國立交通大學 |
2014-12-08T15:47:25Z |
An extraction method to determine interconnect parasitic parameters
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Chao, CJ; Wong, SC; Chen, MJ; Liew, BK |
| 國立交通大學 |
2014-12-08T15:44:34Z |
Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology
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Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:55Z |
Arsenic/phosphorus LDD optimization by taking advantage of phosphorus transient enhanced diffusion for high voltage input/output CMOS devices
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Wang, HCH; Wang, CC; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
Showing items 1-4 of 4 (1 Page(s) Totally)
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