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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:10:43Z	Anomalous Gate-Edge Leakage Induced by High Tensile Stress in NMOSFET	Liu, Po-Tsun; Huang, Chen-Shuo; Lim, Peng-Soon; Lee, Da-Yuan; Tsao, Shueh-Wen; Chen, Chi-Chun; Tao, Hun-Jan; Mii, Yuh-Jier

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