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| 國立交通大學 |
2019-04-02T06:00:18Z |
Reoxidation behavior of high-nitrogen oxynitride films after O-2 and N2O treatment
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Lin, BC; Chang, KM; Lai, CH; Hsieh, KY; Yao, JM |
| 國立交通大學 |
2019-04-02T05:59:51Z |
Ultrathin N2O-oxide with atomically flat interfaces
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Chin, A; Chen, WJ; Lin, BC; Kao, JH; Tsai, C; Huang, JCM |
| 國立交通大學 |
2019-04-02T05:59:49Z |
Thin oxides with in situ native oxide removal
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Chin, A; Chen, WJ; Chang, T; Kao, RH; Lin, BC; Tsai, C; Huang, JCM |
| 國立交通大學 |
2019-04-02T05:58:32Z |
High quality epitaxial Si grown by a simple low pressure chemical vapor deposition at 550 degrees C
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Chin, A; Lin, BC; Chen, WJ |
| 國立交通大學 |
2019-04-02T05:58:30Z |
Enhancement of the optical and electrical properties in InGaAlP/InGaP PIN heterostructures by rapid thermal annealing on misoriented substrate
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Chin, A; Lin, HY; Lin, BC |
| 國家衛生研究院 |
2018-05-03 |
The association between ambient temperature and acute diarrhea incidence in Hong Kong, Taiwan, and Japan
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Chen, CC;Lin, BC;Yap, L;Chiang, PH;Chan, TC |
| 國立交通大學 |
2014-12-08T15:47:25Z |
The effect of native oxide on thin gate oxide integrity
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Chin, A; Lin, BC; Chen, WJ; Lin, YB; Thai, C |
| 國立交通大學 |
2014-12-08T15:46:45Z |
Deuterium effect on stress-induced leakage current
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Lin, BC; Cheng, YC; Chin, A; Wang, T; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:32Z |
The leakage current effect of thin gate oxides (2.4-2.7 nm) with in situ native oxide desorption
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Lai, JM; Chieng, WH; Lin, BC; Chin, A; Tsai, C |
| 國立交通大學 |
2014-12-08T15:40:14Z |
Wide-sense nonblocking multicast Log(2) (N, m, p) networks
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Hwang, FK; Lin, BC |
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