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| 臺大學術典藏 |
2019-09-04T06:51:04Z |
A Study of Diagnostic Accuracy Using a Chemical Sensor Array and a Machine Learning Technique to Detect Lung Cancer
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Chi-Hsiang Huang;Zeng, Chian;Yi-Chia Wang;Peng, Hsin-Yi;Lin, Chia-Sheng;Chang, Che-Jui;Hsiao-Yu Yang; CHI-HSIANG HUANG; Zeng, Chian; YI-CHIA WANG; Peng, Hsin-Yi; Lin, Chia-Sheng; Chang, Che-Jui; HSIAO-YU YANG |
| 佛光大學 |
2019 |
線上運動討論社群網路酸文的第三人效果研究: 以批踢踢實業坊【NBA】版為例
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林家聖; LIN, CHIA-SHENG |
| 國立交通大學 |
2018-08-21T05:53:38Z |
Enhanced reactivity of metal/metal oxide-porous carbon nanocomposites for electrochemical and photocatalytic applications
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Doong, Ruey-An; Lin, Chia-Sheng; Bindumadhavan, Kartick |
| 東吳大學 |
2015 |
用精品理念打造價值鏈：以蘋果電腦為例
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林嘉聖; LIN, CHIA-SHENG |
| 國立交通大學 |
2014-12-08T15:47:37Z |
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
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Chen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:38:10Z |
Transient Effect Assisted NBTI Degradation in p-Channel LTPS TFTs under Dynamic Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Hsu, Wei-Che; Jian, Fu-Yen; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:03Z |
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao |
| 國立交通大學 |
2014-12-08T15:30:12Z |
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng |
| 國立交通大學 |
2014-12-08T15:26:31Z |
Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors
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Li, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien |
| 國立交通大學 |
2014-12-08T15:21:32Z |
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
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Chung, Wan-Fang; Chang, Ting-Chang; Lin, Chia-Sheng; Tu, Kuan-Jen; Li, Hung-Wei; Tseng, Tseung-Yuen; Chen, Ying-Chung; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:10:21Z |
Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Hsu, Wei-Che; Chen, Shih-Ching; Li, Hung-Wei; Tu, Kuan-Jen; Jian, Fu-Yen; Chen, Te-Chih |
| 國立交通大學 |
2014-12-08T15:08:23Z |
Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che |
| 國立交通大學 |
2014-12-08T15:08:02Z |
Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect
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Jian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:07:52Z |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan |
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立成功大學 |
2014-08-20 |
涉入程度與券商信任度對處分效果之影響
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林家聖; Lin, Chia-Sheng |
| 國立成功大學 |
2013-09 |
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Tsai, Chih-Tsung; Chen, Shih-Ching; Lin, Chia-Sheng; Jian, Fu-Yen |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
|
Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2007-01-16 |
從消費者保護法上論建築產品之責任
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林嘉盛; Lin, Chia-Sheng |
| 國立成功大學 |
2007-01-16 |
從消費者保護法上論建築產品之責任
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林嘉盛; Lin, Chia-Sheng |
| 國立成功大學 |
2004-07-10 |
蛋白質螺旋體之電腦協助預測系統
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林家盛; Lin, Chia-Sheng |
| 國立成功大學 |
2004-07-10 |
蛋白質螺旋體之電腦協助預測系統
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林家盛; Lin, Chia-Sheng |
Showing items 1-25 of 25 (1 Page(s) Totally)
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