|
"lin chien ting"的相關文件
顯示項目 46-70 / 81 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目
| 東吳大學 |
2011 |
金融海嘯對銀行業資本適足率、經營績效與逾期放款率之影響
|
林建廷; Lin, Chien-Ting |
| 淡江大學 |
2010-10 |
The factors influencing employees' attitudes in high-tech environment
|
Kuo, Tsung-hsien; Ho, Li-an; Wu, Ya-jung; Lin, Chien-ting |
| 國立高雄大學 |
2010-02 |
The Impact of Oxide Traps Induced by SOI Thickness on Reliability of Fully Silicide Metal-Gate Strained SOI MOSFET
|
Lin, Cheng-Li; Chen, Yu-Ting; Huang, Fon-Shan; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立高雄大學 |
2010 |
Improvement of TDDB reliability, characteristics of HfO2 high-k/metal gate MOSFET device with oxygen post deposition annealing
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Chiang, Yen-Ting; Juang, Feng-Renn; Lin, Chien-Ting; Lai, Chien-Ming |
| 國立臺灣大學 |
2010 |
The Incidence of Chronic Lymphocytic Leukemia in Taiwan, 1986-2005: A Distinct Increasing Trend with Birth-Cohort Effect
|
吳尚儒; 黃聖懿; 林建廷; 林育志; 張啟仁; 田蕙芬; WU, SHANG-JU; HUANG, SHANG-YI; LIN, CHIEN-TING; LIN, YU-JR; CHANG, CHEE-JEN; TIEN, HWEI-FANG |
| 國立高雄大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
| 國立成功大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
| 淡江大學 |
2009-05 |
教育科技專業人員專案管理能力分析之研究
|
何俐安; Ho, Li-An; 郭宗賢; Kuo, Tsung-Hsien; 林建廷; Lin, Chien-Ting; 陳怡如; Chen, Yi-Ru; 廖芳君; Liao, Fang-Chun |
| 國立高雄大學 |
2009-03 |
The Impact of Strain Technology on FUSI Gate SOI CMOSFET
|
Yeh, Wen-Kuan; Wang, Jean-An; Tsai, Ming-Hsing; Lin, Chien-Ting; Chen, Po-Ying |
| 國立成功大學 |
2008-11 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立高雄大學 |
2008-10 |
Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike |
| 國立成功大學 |
2008-09-01 |
Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike |
| 國立高雄大學 |
2008-07 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立成功大學 |
2008-04 |
Effect of etch stop layer stress on negative bias temperature instability of deep submicron p-type metal-oxide-semiconductor field effect transistors with dual gate oxide
|
Chen, Ming-Shing; Fang, Yean-Kuen; Lee, Tung-Hsing; Lin, Chien-Ting; Chiang, Yen-Ting; Ko, Joe; Sheu, Yau Kae; Shen, Tsong Lin; Liao, Wen Yi |
| 國立高雄大學 |
2008 |
The impact of stain technology on FUSI gate SOI CMOSFET and device performance enhancement for 45nm node and beyond
|
Yeh, Wen-Kuan; Wang, Jean-An; Lin, Chien-Ting; Cheng, Li-Wei; Ma, Mike |
| 國立成功大學 |
2007-12-07 |
先進應變工程及完全金屬矽化閘極應用於奈米金氧半電晶體的之研究
|
林建廷; Lin, Chien-Ting |
| 國立成功大學 |
2007-12-07 |
先進應變工程及完全金屬矽化閘極應用於奈米金氧半電晶體的之研究
|
林建廷; Lin, Chien-Ting |
| 國立成功大學 |
2007-09 |
CMOS dual-work-function engineering by using implanted Ni-FUSI
|
Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike |
| 國立成功大學 |
2007-07-19 |
市場條件對投資人處份效果之影響
|
林建廷; Lin, Chien-Ting |
| 國立高雄大學 |
2007-05 |
Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET
|
Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa |
| 國立成功大學 |
2007-05 |
Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET
|
Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa |
| 國立高雄大學 |
2007-04-30 |
Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan |
| 國立成功大學 |
2007-04 |
Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan |
| 國立成功大學 |
2007-04 |
Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90 nm complementary metal oxide semiconductor field effect transistor
|
Lin, Chien-Ting; Fang, Yean-Kuen; Lai, Chieh-Ming; Yeh, Wen-Kuan; Hsu, Che-Hua; Cheng, Li-Wei; Huang, Yao-Tsung; Ma, Guang Hwa |
| 淡江大學 |
2007-03 |
Practice makes better? A study of meditation learners in a classroom environment
|
Lin, Chin-yen; Kuo, Tsung-hsien; Kuo, Yen-ku; Kuo, Yen-lin; 何俐安; Ho, Li-an; Lin, Chien-ting |
顯示項目 46-70 / 81 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目
|
