|
English
|
正體中文
|
简体中文
|
總筆數 :0
|
|
造訪人次 :
52612023
線上人數 :
897
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
"lin chin tsai"的相關文件
顯示項目 36-45 / 79 (共8頁) << < 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
| 元培科技大學 |
2006-03 |
The Cutoff Transaction Size and Quadratic Concave Holding and Penalty Cost Functions to the Information Value Applying to the Newsboy Model
|
Lin, Chin-Tsai;Tsai, Hui-Yin |
| 國立高雄應用科技大學 |
2006 |
CAR: A Low Latency Video-on-Demand Broadcasting Scheme for Heterogeneous Receivers
|
Lin, Chin-Tsai; Ding, Jen-Wen |
| 國立高雄大學 |
2006 |
Editorial:some measurement methods are applied to business performance management
|
Lu, Kuen-Horng; Lin, Chin-Tsai; Huang, Ing-Chung |
| 元培科技大學 |
2006 |
Model for measuring quality of software in DVRS using the gap concept and fuzzy schemes with GA
|
Chen, Chie-Bein; Lin, Chin-Tsai ;Wang, Chun-Hsien; Chang, Che-Wei |
| 元培科技大學 |
2006 |
A Simple Approach to Solving Multi-Response Quality Characteristic Problems in CMOS Ion Implantation
|
Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein |
| 元培科技大學 |
2006 |
The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis
|
Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein |
| 元培科技大學 |
2006 |
Model for measuring quality of software in DVRS using the gap concept and fuzzy schemes with GA
|
Chen, Chie-Bein; Lin, Chin-Tsai; Wang, Chun-Hsien ; Chang, Che-Wei |
| 元培科技大學 |
2006 |
The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis
|
Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein |
| 元培科技大學 |
2006 |
Online Experts Screening the Worst Machine to Raise Wafer Yield via the Analytic Hierarchy Process
|
Lin, Chin-Tsai; Chang, Che-Wei, Wu, Cheng-Ru; Chen, Huang-Chu |
| 元培科技大學 |
2005-10-22 |
EValuating optimal location Selection of Taiwanese hospitals using the Analytic Hierarchy Process
|
Lin Chin-Tsai; Wu Cheng-Ru ; Chen Huang-chu |
顯示項目 36-45 / 79 (共8頁) << < 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
|