English  |  正體中文  |  简体中文  |  總筆數 :0  
造訪人次 :  52612023    線上人數 :  897
教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
關於TAIR

瀏覽

消息

著作權

相關連結

"lin chin tsai"的相關文件

回到依作者瀏覽
依題名排序 依日期排序

顯示項目 36-45 / 79 (共8頁)
<< < 1 2 3 4 5 6 7 8 > >>
每頁顯示[10|25|50]項目

機構 日期 題名 作者
元培科技大學 2006-03 The Cutoff Transaction Size and Quadratic Concave Holding and Penalty Cost Functions to the Information Value Applying to the Newsboy Model Lin, Chin-Tsai;Tsai, Hui-Yin
國立高雄應用科技大學 2006 CAR: A Low Latency Video-on-Demand Broadcasting Scheme for Heterogeneous Receivers Lin, Chin-Tsai; Ding, Jen-Wen
國立高雄大學 2006 Editorial:some measurement methods are applied to business performance management Lu, Kuen-Horng; Lin, Chin-Tsai; Huang, Ing-Chung
元培科技大學 2006 Model for measuring quality of software in DVRS using the gap concept and fuzzy schemes with GA Chen, Chie-Bein; Lin, Chin-Tsai ;Wang, Chun-Hsien; Chang, Che-Wei
元培科技大學 2006 A Simple Approach to Solving Multi-Response Quality Characteristic Problems in CMOS Ion Implantation Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein
元培科技大學 2006 The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein
元培科技大學 2006 Model for measuring quality of software in DVRS using the gap concept and fuzzy schemes with GA Chen, Chie-Bein; Lin, Chin-Tsai; Wang, Chun-Hsien ; Chang, Che-Wei
元培科技大學 2006 The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis Lin, Chin-Tsai; Chang, Che-Wei ; Chen, Chie-Bein
元培科技大學 2006 Online Experts Screening the Worst Machine to Raise Wafer Yield via the Analytic Hierarchy Process Lin, Chin-Tsai; Chang, Che-Wei, Wu, Cheng-Ru; Chen, Huang-Chu
元培科技大學 2005-10-22 EValuating optimal location Selection of Taiwanese hospitals using the Analytic Hierarchy Process Lin Chin-Tsai; Wu Cheng-Ru ; Chen Huang-chu

顯示項目 36-45 / 79 (共8頁)
<< < 1 2 3 4 5 6 7 8 > >>
每頁顯示[10|25|50]項目