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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立成功大學 |
2009-04 |
Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal-Oxide-Semiconductor Field-Effect Transistors
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Wu, San-Lein; Wu, Chung Yi; Lin, Hau-Yu; Kuo, Cheng-Wen; Chen, Shin-Hsin; Lin, Chung Hsiung; Chang, Shoou-Jinn |
國立高雄第一科技大學 |
2008-07-08 |
GoF的Design Patterns範例實作
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林忠雄; Lin Chung-Hsiung |
國立成功大學 |
2007-05 |
Impact of SiN on performance in novel complementary metal-oxide-semiconductor architecture using substrate strained-SiGe and mechanical strained-Si technology
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Lin, Chung-Hsiung; Wu, San-Lein; Wu, Chung-Yi; Kang, Ting-Kuo; Huang, Kuang-Chih; Chang, Shoou-Jinn |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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