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Institution Date Title Author
國立成功大學 2009-04 Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal-Oxide-Semiconductor Field-Effect Transistors Wu, San-Lein; Wu, Chung Yi; Lin, Hau-Yu; Kuo, Cheng-Wen; Chen, Shin-Hsin; Lin, Chung Hsiung; Chang, Shoou-Jinn
國立高雄第一科技大學 2008-07-08 GoF的Design Patterns範例實作 林忠雄; Lin Chung-Hsiung
國立成功大學 2007-05 Impact of SiN on performance in novel complementary metal-oxide-semiconductor architecture using substrate strained-SiGe and mechanical strained-Si technology Lin, Chung-Hsiung; Wu, San-Lein; Wu, Chung-Yi; Kang, Ting-Kuo; Huang, Kuang-Chih; Chang, Shoou-Jinn

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