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Institution Date Title Author
國立交通大學 2018-08-21T05:53:37Z Enhanced stability of thin film transistors with double-stacked amorphous IWO/IWO:N channel layer Lin, Dong; Pi, Shubin; Yang, Jianwen; Tiwari, Nidhi; Ren, Jinhua; Zhang, Qun; Liu, Po-Tsun; Shieh, Han-Ping
國立交通大學 2018-08-21T05:53:28Z The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film Transistors Fu, Ruofan; Yang, Jianwen; Chang, Wei-Chiao; Chang, Wei-Cheng; Chang, Chien-Min; Lin, Dong; Zhang, Qun; Liu, Po-Tsun; Shieh, Han-Ping D.

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