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"lin hau yu"的相關文件
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| 國立交通大學 |
2019-04-03T06:47:55Z |
Nearly Dislocation-free Ge/Si Heterostructures by Using Nanoscale Epitaxial Growth Method
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Luo, Guang-Li; Ko, Chih-Hsin; Wann, Clement H.; Chung, Cheng-Ting; Han, Zong-You; Cheng, Chao-Ching; Chang, Chun-Yen; Lin, Hau-Yu; Chien, Chao-Hsin |
| 國立交通大學 |
2017-04-21T06:49:53Z |
III-V MOSFETs with a New Self-Aligned Contact
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Zhang, Xingui; Guo, Huaxin; Ko, Chih-Hsin; Wann, Clement H.; Cheng, Chao-Ching; Lin, Hau-Yu; Chin, Hock-Chun; Gong, Xiao; Lim, Phyllis Shi Ya; Luo, Guang-Li; Chang, Chun-Yen; Chien, Chao-Hsin; Han, Zong-You; Huang, Shih-Chiang; Yeo, Yee-Chia |
| 國立交通大學 |
2014-12-08T15:11:35Z |
Self-aligned contact metallization technology for III-V metal-oxide-semiconductor field effect transistors
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Zhang, Xingui; Guo, Huaxin; Lin, Hau-Yu; Cheng, Chao-Ching; Ko, Chih-Hsin; Wann, Clement H.; Luo, Guang-Li; Chang, Chun-Yen; Chien, Chao-Hsin; Han, Zong-You; Huang, Shih-Chiang; Chin, Hock-Chun; Gong, Xiao; Koh, Shao-Ming; Lim, Phyllis Shi Ya; Yeo, Yee-Chia |
| 國立交通大學 |
2014-12-08T15:10:19Z |
The Annihilation of Threading Dislocations in the Germanium Epitaxially Grown within the Silicon Nanoscale Trenches
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Luo, Guang-Li; Huang, Shih-Chiang; Ko, Chih-Hsin; Wann, Clement H.; Chung, Cheng-Ting; Han, Zong-You; Cheng, Chao-Ching; Chang, Chun-Yen; Lin, Hau-Yu; Chien, Chao-Hsin |
| 國立交通大學 |
2014-12-08T15:07:51Z |
Ge Epitaxial Growth on GaAs Substrates for Application to Ge-Source/Drain GaAs MOSFETs
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Luo, Guang-Li; Han, Zong-You; Chien, Chao-Hsin; Ko, Chih-Hsin; Wann, Clement H.; Lin, Hau-Yu; Shen, Yi-Ling; Chung, Cheng-Ting; Huang, Shih-Chiang; Cheng, Chao-Ching; Changb, Chun-Yen |
| 國立成功大學 |
2013-10 |
Embedded-Ge source and drain in InGaAs/GaAs dual channel MESFET
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Hung, Shang-Chao; Luan, Qiuping; Lin, Hau-Yu; Li, Shuguang; Chang, Shoou-Jinn |
| 國立成功大學 |
2011-07-22 |
研究基板應變矽技術和三五族化合物半導體以實現高性能電晶體元件
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林浩宇; Lin, Hau-Yu |
| 國立成功大學 |
2011-07-08 |
研究基板應變矽技術和三五族化合物半導體以實現高性能電晶體元件
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林浩宇; Lin, Hau-Yu |
| 國立成功大學 |
2011-04 |
Investigation of stress memorization process on low-frequency noise performance for strained Si n-type metal-oxide-semiconductor field-effect transistors
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Kuo, Cheng-Wen;Wu, San-Lein;Lin, Hau-Yu;Huang, Yao-Tsung;Chang, Shoou-Jinn;Hong, De-Gong;Wu, Chung-Yi;Cheng, Yao-Chin;Cheng, Osbert |
| 國立成功大學 |
2011-03-21 |
Influences of surface reconstruction on the atomic-layer-deposited HfO(2)/Al(2)O(3)/n-InAs metal-oxide-semiconductor capacitors
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Lin, Hau-Yu; Wu, San-Lein; Cheng, Chao-Ching; Ko, Chih-Hsin; Wann, Clement H.; Lin, You-Ru; Chang, Shoou-Jinn; Wu, Tai-Bor |
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