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Showing items 106-130 of 652  (27 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:45:15Z Improved ultrathin gate oxide integrity in p(+)-polysilicon-gate p-channel metal oxide semiconductor with medium-dose fluorine implantation Chen, CC; Lin, HC; Chang, CY; Huang, TY; Chien, CH; Liang, MS
國立交通大學 2014-12-08T15:45:05Z Plasma-induced charging damage in ultrathin (3-nm) gate oxides Chen, CC; Lin, HC; Chang, CY; Liang, MS; Chien, CH; Hsien, SK; Huang, TY; Chao, TS
國立交通大學 2014-12-08T15:44:58Z Fused-ring and linking group effects of proton donors and accepters on simple H-bonded liquid crystals Lin, HC; Shiaws, JM; Wu, CY; Tsai, CT
國立交通大學 2014-12-08T15:44:57Z Plasma-process-induced damage in sputtered TiN metal-gate capacitors with ultrathin nitrided oxides Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, TY; Liang, MS
國立交通大學 2014-12-08T15:44:24Z H-bonded effects on supramolecular liquid crystalline trimers containing photoluminescent cores Lin, HC; Sheu, HY; Chang, CL; Tsai, CT
國立交通大學 2014-12-08T15:44:20Z A novel thin-film transistor with self-aligned field induced drain Lin, HC; Yu, CM; Lin, CY; Yeh, KL; Huang, TY; Lei, TF
國立交通大學 2014-12-08T15:43:58Z Schottky barrier thin-film transistor (SBTFT) with silicided source/drain and field-induced drain extension Lin, HC; Yeh, KL; Huang, RG; Lin, CY; Huang, TY
國立交通大學 2014-12-08T15:43:44Z Synthesis of novel acetal thia-cage compounds Wu, CY; Lin, HC; Wang, ZY; Wu, HJ
國立交通大學 2014-12-08T15:43:41Z Post-soft-breakdown characteristics of deep submicron NMOSFETs with ultrathin gate oxide Tsai, MY; Lin, HC; Lee, DY; Huang, TY
國立交通大學 2014-12-08T15:43:37Z Conduction mechanisms for off-state leakage current of Schottky barrier thin-film transistors Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY
國立交通大學 2014-12-08T15:42:51Z Impact of thermal stability on the characteristics of complementary metal oxide semiconductor transistors with TiN metal gate Wang, MF; Huang, TY; Kao, YC; Lin, HC; Chang, CY
國立交通大學 2014-12-08T15:42:48Z Ambipolar Schottky-barrier TFTs Lin, HC; Yeh, KL; Huang, TY; Huang, RG; Sze, SM
國立交通大學 2014-12-08T15:42:37Z Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH
國立交通大學 2014-12-08T15:42:37Z Reduction of off-state leakage current in Schottky barrier thin-film transistors (SBTFT) by a field-induced drain Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY
國立交通大學 2014-12-08T15:42:25Z Characteristics of polycrystalline silicon thin-film transistors with electrical source/drain extensions induced by a bottom sub-gate Yu, M; Lin, HC; Chen, GH; Huang, TY; Lei, TF
國立交通大學 2014-12-08T15:42:20Z Application of field-induced source/drain Schottky metal-oxide-semiconductor to fin-like body field-effect transistor Lin, HC; Wang, MF; Hou, FJ; Liu, JT; Huang, TY; Sze, SM
國立交通大學 2014-12-08T15:42:17Z Charge pumping profiling technique for the evaluation of plasma-charging-enhanced hot-carrier effect in short-N-channel metal-oxide-semiconductor field-effect transistors Chen, SJ; Chung, SSS; Lin, HC
國立交通大學 2014-12-08T15:42:06Z Self-aligned fabrication of thin-film transistors with field-induced drain Yu, CM; Lin, HC; Lin, CY; Yeh, KL; Huang, TY; Lei, TF
國立交通大學 2014-12-08T15:41:57Z Simultaneous etching of polysilicon materials with different doping types by low-damage transformer-coupled plasma technique Hung, CC; Lin, HC; Wang, MF; Huang, TY; Shih, HC
國立交通大學 2014-12-08T15:41:52Z Breakdown modes and their evolution in ultrathin gate oxide Lin, HC; Lee, DY; Huang, TY
國立交通大學 2014-12-08T15:41:22Z Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistors Lin, HC; Wang, MF; Lu, CY; Huang, TY
國立交通大學 2014-12-08T15:41:20Z High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctions Lin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY
國立交通大學 2014-12-08T15:41:10Z Fabrication and characterization of Schottky barrier polysilicon thin-film transistors with excimer-laser crystallized channel Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY
國立交通大學 2014-12-08T15:41:01Z Enhanced negative substrate bias degradation in nMOSFETs with ultrathin plasma nitrided oxide Perng, TH; Chien, CH; Chen, CW; Lin, HC; Chang, CY; Huang, TY
國立交通大學 2014-12-08T15:40:05Z H-2 and NH3 plasma passivation on poly-Si TFTs with bottom-sub-gate induced electrical junctions Yu, CM; Lin, HC; Huang, TY; Lei, TF

Showing items 106-130 of 652  (27 Page(s) Totally)
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