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Showing items 101-150 of 652 (14 Page(s) Totally)
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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:46:00Z	The combined effects of nitrogen implantation at S/D extension and N2O oxide on 0.18 mu m N- and P-metal oxide field effect transistors (MOSFETs)	Chao, TS; Chang, SJ; Chien, CH; Lin, HC; Huang, TY; Chang, CY
國立交通大學	2014-12-08T15:45:54Z	Optical and electrical investigations of isoelectronic In-doped GaN films	Shu, CK; Lee, WH; Pan, YC; Chen, CC; Lin, HC; Ou, J; Chen, WH; Chen, WK; Lee, MC
國立交通大學	2014-12-08T15:45:52Z	Improved immunity to plasma damage in ultrathin nitrided oxides	Chen, CC; Lin, HC; Chang, CY; Liang, MS; Chien, CH; Hsien, SK; Huang, TY
國立交通大學	2014-12-08T15:45:47Z	Synthesis of diacetal trioxa-cage compounds via reaction of bicycle [2.2.1]heptenes and bicyclo[2.2.2]octenes with dimethyldioxirane	Lin, HC; Wu, HJ
國立交通大學	2014-12-08T15:45:46Z	Effects of polysilicon gate doping concentration on plasma charging damage in ultrathin gate oxides	Chen, CC; Lin, HC; Chang, CY; Huang, TY; Chien, CH; Liang, MS
國立交通大學	2014-12-08T15:45:15Z	Improved ultrathin gate oxide integrity in p(+)-polysilicon-gate p-channel metal oxide semiconductor with medium-dose fluorine implantation	Chen, CC; Lin, HC; Chang, CY; Huang, TY; Chien, CH; Liang, MS
國立交通大學	2014-12-08T15:45:05Z	Plasma-induced charging damage in ultrathin (3-nm) gate oxides	Chen, CC; Lin, HC; Chang, CY; Liang, MS; Chien, CH; Hsien, SK; Huang, TY; Chao, TS
國立交通大學	2014-12-08T15:44:58Z	Fused-ring and linking group effects of proton donors and accepters on simple H-bonded liquid crystals	Lin, HC; Shiaws, JM; Wu, CY; Tsai, CT
國立交通大學	2014-12-08T15:44:57Z	Plasma-process-induced damage in sputtered TiN metal-gate capacitors with ultrathin nitrided oxides	Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, TY; Liang, MS
國立交通大學	2014-12-08T15:44:24Z	H-bonded effects on supramolecular liquid crystalline trimers containing photoluminescent cores	Lin, HC; Sheu, HY; Chang, CL; Tsai, CT
國立交通大學	2014-12-08T15:44:20Z	A novel thin-film transistor with self-aligned field induced drain	Lin, HC; Yu, CM; Lin, CY; Yeh, KL; Huang, TY; Lei, TF
國立交通大學	2014-12-08T15:43:58Z	Schottky barrier thin-film transistor (SBTFT) with silicided source/drain and field-induced drain extension	Lin, HC; Yeh, KL; Huang, RG; Lin, CY; Huang, TY
國立交通大學	2014-12-08T15:43:44Z	Synthesis of novel acetal thia-cage compounds	Wu, CY; Lin, HC; Wang, ZY; Wu, HJ
國立交通大學	2014-12-08T15:43:41Z	Post-soft-breakdown characteristics of deep submicron NMOSFETs with ultrathin gate oxide	Tsai, MY; Lin, HC; Lee, DY; Huang, TY
國立交通大學	2014-12-08T15:43:37Z	Conduction mechanisms for off-state leakage current of Schottky barrier thin-film transistors	Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY
國立交通大學	2014-12-08T15:42:51Z	Impact of thermal stability on the characteristics of complementary metal oxide semiconductor transistors with TiN metal gate	Wang, MF; Huang, TY; Kao, YC; Lin, HC; Chang, CY
國立交通大學	2014-12-08T15:42:48Z	Ambipolar Schottky-barrier TFTs	Lin, HC; Yeh, KL; Huang, TY; Huang, RG; Sze, SM
國立交通大學	2014-12-08T15:42:37Z	Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage	Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH
國立交通大學	2014-12-08T15:42:37Z	Reduction of off-state leakage current in Schottky barrier thin-film transistors (SBTFT) by a field-induced drain	Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY
國立交通大學	2014-12-08T15:42:25Z	Characteristics of polycrystalline silicon thin-film transistors with electrical source/drain extensions induced by a bottom sub-gate	Yu, M; Lin, HC; Chen, GH; Huang, TY; Lei, TF
國立交通大學	2014-12-08T15:42:20Z	Application of field-induced source/drain Schottky metal-oxide-semiconductor to fin-like body field-effect transistor	Lin, HC; Wang, MF; Hou, FJ; Liu, JT; Huang, TY; Sze, SM
國立交通大學	2014-12-08T15:42:17Z	Charge pumping profiling technique for the evaluation of plasma-charging-enhanced hot-carrier effect in short-N-channel metal-oxide-semiconductor field-effect transistors	Chen, SJ; Chung, SSS; Lin, HC
國立交通大學	2014-12-08T15:42:06Z	Self-aligned fabrication of thin-film transistors with field-induced drain	Yu, CM; Lin, HC; Lin, CY; Yeh, KL; Huang, TY; Lei, TF
國立交通大學	2014-12-08T15:41:57Z	Simultaneous etching of polysilicon materials with different doping types by low-damage transformer-coupled plasma technique	Hung, CC; Lin, HC; Wang, MF; Huang, TY; Shih, HC
國立交通大學	2014-12-08T15:41:52Z	Breakdown modes and their evolution in ultrathin gate oxide	Lin, HC; Lee, DY; Huang, TY
國立交通大學	2014-12-08T15:41:22Z	Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistors	Lin, HC; Wang, MF; Lu, CY; Huang, TY
國立交通大學	2014-12-08T15:41:20Z	High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctions	Lin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY
國立交通大學	2014-12-08T15:41:10Z	Fabrication and characterization of Schottky barrier polysilicon thin-film transistors with excimer-laser crystallized channel	Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY
國立交通大學	2014-12-08T15:41:01Z	Enhanced negative substrate bias degradation in nMOSFETs with ultrathin plasma nitrided oxide	Perng, TH; Chien, CH; Chen, CW; Lin, HC; Chang, CY; Huang, TY
國立交通大學	2014-12-08T15:40:05Z	H-2 and NH3 plasma passivation on poly-Si TFTs with bottom-sub-gate induced electrical junctions	Yu, CM; Lin, HC; Huang, TY; Lei, TF
國立交通大學	2014-12-08T15:39:42Z	Effects of process and gate doping species on negative-bias-temperature instability of p-channel MOSFETs	Lee, DY; Huang, TY; Lin, HC; Chiang, WJ; Huang, GW; Wanga, T
國立交通大學	2014-12-08T15:39:25Z	Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors	Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY
國立交通大學	2014-12-08T15:39:08Z	Synthesis and second-order nonlinearities of chiral prolinol-substituted chromophores	Chou, SSP; Yu, CY; Lin, HC; Yang, PK
國立交通大學	2014-12-08T15:39:04Z	Effect of polar substituents on the properties of 1,3,4-oxadiazole-based liquid crystalline materials containing asymmetric cores	Sung, HH; Lin, HC
國立交通大學	2014-12-08T15:38:50Z	Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes	Pearn, WL; Wu, CW; Lin, HC
國立交通大學	2014-12-08T15:38:42Z	Thermal properties, miscibility and specific interactions in comparison of linear and star poly(methyl methacrylate) blend with phenolic	Huang, CF; Kuo, SW; Lin, HC; Chen, JK; Chen, YK; Xu, HY; Chang, FC
國立交通大學	2014-12-08T15:37:26Z	Novel alternating fluorene-based conjugated polymers containing oxadiazole pendants with various terminal groups	Sung, HH; Lin, HC
國立交通大學	2014-12-08T15:37:13Z	CoTiO3 high-kappa, dielectrics on HSG for DRAM applications	Chao, TS; Ku, WM; Lin, HC; Landheer, D; Wang, YY; Mori, Y
國立交通大學	2014-12-08T15:37:06Z	Determination of effective density-of-states using a novel Schottky barrier poly-Si thin-film transistor	Lin, HC; Lee, MH; Yeh, KL; Huang, TY
國立交通大學	2014-12-08T15:37:06Z	Localized lateral growth of single-walled carbon nanotubes for field-effect transistors by a cobalt-mix-TEOS method	Chen, BH; Lo, PY; Wei, JH; Tsai, MJ; Hwang, CL; Chao, TS; Lin, HC; Huang, TY
國立交通大學	2014-12-08T15:27:25Z	A model for photoresist-induced charging damage in ultra-thin gate oxides	Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY
國立交通大學	2014-12-08T15:27:16Z	The effects of isoelectronic in-doping in GaN films grown by MOCVD	Shu, CK; Ou, J; Lin, HC; Pan, YC; Lee, WH; Chen, WK; Lee, MC
國立交通大學	2014-12-08T15:27:09Z	Breakdown characteristics of ultra-thin gate oxides caused by plasma charging	Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY
國立交通大學	2014-12-08T15:27:02Z	Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide	Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS
國立交通大學	2014-12-08T15:27:02Z	Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation	Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS
國立交通大學	2014-12-08T15:26:54Z	Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors	Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY
國立交通大學	2014-12-08T15:26:48Z	New experimental evidences of the plasma charging enhanced hot carrier effect and its impact on surface channel CMOS devices	Chen, SJ; Lin, CC; Chung, SS; Lin, HC
國立交通大學	2014-12-08T15:26:36Z	Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs	Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T
國立交通大學	2014-12-08T15:26:29Z	Process-related reliability issues toward sub-100 nm device regime	Chang, CY; Chao, TS; Lin, HC; Chien, CH
國立交通大學	2014-12-08T15:26:17Z	Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate	Yu, CM; Lin, HC; Lei, TF; Huang, TY

Showing items 101-150 of 652 (14 Page(s) Totally)
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