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Showing items 126-150 of 652 (27 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:41:22Z |
Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistors
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Lin, HC; Wang, MF; Lu, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:20Z |
High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctions
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Lin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:10Z |
Fabrication and characterization of Schottky barrier polysilicon thin-film transistors with excimer-laser crystallized channel
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Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:01Z |
Enhanced negative substrate bias degradation in nMOSFETs with ultrathin plasma nitrided oxide
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Perng, TH; Chien, CH; Chen, CW; Lin, HC; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:40:05Z |
H-2 and NH3 plasma passivation on poly-Si TFTs with bottom-sub-gate induced electrical junctions
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Yu, CM; Lin, HC; Huang, TY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:39:42Z |
Effects of process and gate doping species on negative-bias-temperature instability of p-channel MOSFETs
|
Lee, DY; Huang, TY; Lin, HC; Chiang, WJ; Huang, GW; Wanga, T |
| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
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Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立交通大學 |
2014-12-08T15:39:08Z |
Synthesis and second-order nonlinearities of chiral prolinol-substituted chromophores
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Chou, SSP; Yu, CY; Lin, HC; Yang, PK |
| 國立交通大學 |
2014-12-08T15:39:04Z |
Effect of polar substituents on the properties of 1,3,4-oxadiazole-based liquid crystalline materials containing asymmetric cores
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Sung, HH; Lin, HC |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
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Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:38:42Z |
Thermal properties, miscibility and specific interactions in comparison of linear and star poly(methyl methacrylate) blend with phenolic
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Huang, CF; Kuo, SW; Lin, HC; Chen, JK; Chen, YK; Xu, HY; Chang, FC |
| 國立交通大學 |
2014-12-08T15:37:26Z |
Novel alternating fluorene-based conjugated polymers containing oxadiazole pendants with various terminal groups
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Sung, HH; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:13Z |
CoTiO3 high-kappa, dielectrics on HSG for DRAM applications
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Chao, TS; Ku, WM; Lin, HC; Landheer, D; Wang, YY; Mori, Y |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Determination of effective density-of-states using a novel Schottky barrier poly-Si thin-film transistor
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Lin, HC; Lee, MH; Yeh, KL; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Localized lateral growth of single-walled carbon nanotubes for field-effect transistors by a cobalt-mix-TEOS method
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Chen, BH; Lo, PY; Wei, JH; Tsai, MJ; Hwang, CL; Chao, TS; Lin, HC; Huang, TY |
| 國立交通大學 |
2014-12-08T15:27:25Z |
A model for photoresist-induced charging damage in ultra-thin gate oxides
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Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:16Z |
The effects of isoelectronic in-doping in GaN films grown by MOCVD
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Shu, CK; Ou, J; Lin, HC; Pan, YC; Lee, WH; Chen, WK; Lee, MC |
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
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Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide
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Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation
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Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:26:54Z |
Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors
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Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:26:48Z |
New experimental evidences of the plasma charging enhanced hot carrier effect and its impact on surface channel CMOS devices
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Chen, SJ; Lin, CC; Chung, SS; Lin, HC |
| 國立交通大學 |
2014-12-08T15:26:36Z |
Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs
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Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T |
| 國立交通大學 |
2014-12-08T15:26:29Z |
Process-related reliability issues toward sub-100 nm device regime
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Chang, CY; Chao, TS; Lin, HC; Chien, CH |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate
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Yu, CM; Lin, HC; Lei, TF; Huang, TY |
Showing items 126-150 of 652 (27 Page(s) Totally)
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