English  |  正體中文  |  简体中文  |  Total items :0  
Visitors :  52804609    Online Users :  558
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

"lin hc"

Return to Browse by Author
Sorting by Title Sort by Date

Showing items 141-150 of 652  (66 Page(s) Totally)
<< < 10 11 12 13 14 15 16 17 18 19 > >>
View [10|25|50] records per page

Institution Date Title Author
國立交通大學 2014-12-08T15:27:25Z A model for photoresist-induced charging damage in ultra-thin gate oxides Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:27:16Z The effects of isoelectronic in-doping in GaN films grown by MOCVD Shu, CK; Ou, J; Lin, HC; Pan, YC; Lee, WH; Chen, WK; Lee, MC
國立交通大學 2014-12-08T15:27:09Z Breakdown characteristics of ultra-thin gate oxides caused by plasma charging Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY
國立交通大學 2014-12-08T15:27:02Z Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS
國立交通大學 2014-12-08T15:27:02Z Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS
國立交通大學 2014-12-08T15:26:54Z Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY
國立交通大學 2014-12-08T15:26:48Z New experimental evidences of the plasma charging enhanced hot carrier effect and its impact on surface channel CMOS devices Chen, SJ; Lin, CC; Chung, SS; Lin, HC
國立交通大學 2014-12-08T15:26:36Z Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T
國立交通大學 2014-12-08T15:26:29Z Process-related reliability issues toward sub-100 nm device regime Chang, CY; Chao, TS; Lin, HC; Chien, CH
國立交通大學 2014-12-08T15:26:17Z Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate Yu, CM; Lin, HC; Lei, TF; Huang, TY

Showing items 141-150 of 652  (66 Page(s) Totally)
<< < 10 11 12 13 14 15 16 17 18 19 > >>
View [10|25|50] records per page