| 國立交通大學 |
2014-12-08T15:15:29Z |
Characterizing the channel backscattering behavior in nanoscale strained complementary metal oxide semiconductor field-effect transistors
|
Lin, Hono-Nien; Chen, Hung-Wei; Ko, Chih-Hsin; Ge, Chung-Hu; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Wen-Chin |
| 國立交通大學 |
2014-12-08T15:14:39Z |
Spatially and temporally resolving the degradation of n-channel poly-Si thin-film transistors under hot-carrier stressing
|
Lee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih |
| 國立交通大學 |
2014-12-08T15:14:38Z |
Impacts of SiN-capping layer on the device characteristics and hot-carrier degradation of nMOSFETs
|
Lu, Chia-Yu; Lin, Horng-Chih; Lee, Yao-Jen; Shie, Yu-Lin; Chao, Chih-Cheng |
| 國立交通大學 |
2014-12-08T15:14:31Z |
High-performance poly-Si nanowire NMOS transistors
|
Lin, Horng-Chih; Su, Chun-Jung |
| 國立交通大學 |
2014-12-08T15:14:29Z |
Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN capping
|
Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:13:27Z |
Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation
|
Lee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih |
| 國立交通大學 |
2014-12-08T15:13:23Z |
An innovative understanding of metal-insulator-metal (MIM)-capacitor degradation under constant-current stress
|
Hung, Chi-Chao; Oates, Anthony S.; Lin, Horng-Chih; Chang, Yu-En Percy; Wang, Jia-Lian; Huang, Cheng-Chung; Yau, You-Wen |
| 國立交通大學 |
2014-12-08T15:13:06Z |
Water passivation effect on polycrystalline silicon nanowires
|
Lin, Horng-Chih; Su, Chun-Jung; Hsiao, Cheng-Yun; Yang, Yuh-Shyong; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:12:51Z |
A simple method for sub-100 nm pattern generation with I-line double-patterning technique
|
Tsai, Tzu-I; Lin, Horng-Chih; Jian, Min-Feng; Huang, Tiao-Yuan; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Impacts of Multiple-Gated Configuration on the Characteristics of Poly-Si Nanowire SONOS Devices
|
Hsu, Hsing-Hui; Lin, Horng-Chih; Luo, Cheng-Wei; Su, Chun-Jung; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:11:58Z |
Fabrication of sub-100-nm metal-oxide-semiconductor field-effect transistors with asymmetrical source/drain using I-line double patterning technique
|
Lin, Horng-Chih; Tsai, Tzu-I; Chao, Tien-Sheng; Jian, Min-Feng; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:11:50Z |
Gate-All-Around Junctionless Transistors With Heavily Doped Polysilicon Nanowire Channels
|
Su, Chun-Jung; Tsai, Tzu-I; Liou, Yu-Ling; Lin, Zer-Ming; Lin, Horng-Chih; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:11:16Z |
A novel multiple-gate polycrystalline silicon nanowire transistor featuring an inverse-T gate
|
Lin, Horng-Chih; Hsu, Hsing-Hui; Su, Chun-Jung; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:10:41Z |
Fabrication and Characterization of Multiple-Gated Poly-Si Nanowire Thin-Film Transistors and Impacts of Multiple-Gate Structures on Device Fluctuations
|
Hsu, Hsing-Hui; Liu, Ta-Wei; Chan, Leng; Lin, Chuan-Ding; Huang, Tiao-Yuan; Lin, Horng-Chih |
| 國立交通大學 |
2014-12-08T15:10:06Z |
Performance Improvement of Polycrystalline Silicon Nanowire Thin-Film Transistors by a High-k Capping Layer
|
Lee, Ko-Hui; Hsu, Hsing-Hui; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:09:56Z |
Origin of hysteresis in current-voltage characteristics of polycrystalline silicon thin-film transistors
|
Lin, Horng-Chih; Hung, Cheng-Hsiung; Chen, Wei-Chen; Lin, Zer-Ming; Hsu, Hsing-Hui; Hunag, Tiao-Yuang |
| 國立交通大學 |
2014-12-08T15:09:52Z |
Threshold-Voltage Fluctuation of Double-Gated Poly-Si Nanowire Field-Effect Transistor
|
Hsu, Hsing-Hui; Lin, Horng-Chih; Chan, Leng; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:09:26Z |
Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer
|
Lu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:09:22Z |
Performance Enhancement in Double-Gated Poly-Si Nanowire Transistors With Reduced Nanowire Channel Thickness
|
Lin, Horng-Chih; Chen, Wei-Chen; Lin, Chuan-Ding; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:09:19Z |
Poly-silicon nanowire field-effect transistor for ultrasensitive and label-free detection of pathogenic avian influenza DNA
|
Lin, Chih-Heng; Hung, Cheng-Hsiung; Hsiao, Cheng-Yun; Lin, Horng-Chih; Ko, Fu-Hsiang; Yang, Yuh-Shyong |
| 國立交通大學 |
2014-12-08T15:08:53Z |
Electrostatic Discharge Robustness of Si Nanowire Field-Effect Transistors
|
Liu, Wen; Liou, Juin J.; Chung, Andy; Jeong, Yoon-Ha; Chen, Wei-Chen; Lin, Horng-Chih |
| 國立交通大學 |
2014-12-08T15:08:41Z |
Effects of independent double-gated configuration on polycrystalline-Si nonvolatile memory devices
|
Chen, Wei-Chen; Lin, Horng-Chih; Chang, Yu-Chia; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:08:26Z |
Characterization of AC Hot-Carrier Effects in Poly-Si Thin-Film Transistors
|
Lin, Horng-Chih; Chang, Kai-Hsiang; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:07:33Z |
Optimization of SiN film by varying precursor flow conditions and its impacts on strained channel NMOSFETs
|
Lu, Ching-Sen; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:07:24Z |
Insight into the performance enhancement of double-gated polycrystalline silicon thin-film transistors with ultrathin channel
|
Lin, Zer-Ming; Lin, Horng-Chih; Chen, Wei-Chen; Huang, Tiao-Yuan |