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Showing items 191-200 of 232  (24 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:16:15Z Spatially resolving the degradation of SPC thin-film transistors under AC stress Chang, Kai-Hsiang; Lee, Ming-Hsien; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Yao-Jen
國立交通大學 2014-12-08T15:16:14Z A carbon nanotube field effect transistor with tunable conduction-type by electrostatic effects Chen, Bae-Horng; Wei, Jeng-Hua; Lo, Po-Yuan; Wang, Hung-Hsiang; Lai, Ming-Jinn; Tsai, Ming-Jinn; Chao, Tien Sheng; Lin, Horng-Chih; Huang, Tiao-Yuan
國立交通大學 2014-12-08T15:16:08Z Correlating drain-current with strain-induced mobility in nanoscale strained CMOSFETs Lin, Hong-Nien; Chen, Hung-Wei; Ko, Chih-Hsin; Ge, Chung-Hu; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Wen-Chin
國立交通大學 2014-12-08T15:16:00Z Prospect of cobalt-mix-tetraethoxysilane method on localized lateral growth of carbon nanotubes for both p- and n-type field effect transistors Chen, Bae-Horng; Lin, Horng-Chih; Huang, Tiao-Yuan; Wei, Jeng-Hua; Hwang, Chien-Liang; Lo, Po-Yuan; Tsai, Ming-Jinn; Chao, Tien Sheng
國立交通大學 2014-12-08T15:15:40Z Fabrication and characterization of nanowire transistors with solid-phase crystallized poly-Si channels Lin, Horng-Chih; Lee, Ming-Hsien; Su, Chun-Jung; Shen, Shih-Wen
國立交通大學 2014-12-08T15:15:29Z Characterizing the channel backscattering behavior in nanoscale strained complementary metal oxide semiconductor field-effect transistors Lin, Hono-Nien; Chen, Hung-Wei; Ko, Chih-Hsin; Ge, Chung-Hu; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Wen-Chin
國立交通大學 2014-12-08T15:14:39Z Spatially and temporally resolving the degradation of n-channel poly-Si thin-film transistors under hot-carrier stressing Lee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih
國立交通大學 2014-12-08T15:14:38Z Impacts of SiN-capping layer on the device characteristics and hot-carrier degradation of nMOSFETs Lu, Chia-Yu; Lin, Horng-Chih; Lee, Yao-Jen; Shie, Yu-Lin; Chao, Chih-Cheng
國立交通大學 2014-12-08T15:14:31Z High-performance poly-Si nanowire NMOS transistors Lin, Horng-Chih; Su, Chun-Jung
國立交通大學 2014-12-08T15:14:29Z Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN capping Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen

Showing items 191-200 of 232  (24 Page(s) Totally)
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