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"lin juhn jong"的相關文件
顯示項目 96-105 / 115 (共12頁)
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| 國立交通大學 |
2014-12-08T15:20:43Z |
Temporal universal conductance fluctuations in RuO(2) nanowires due to mobile defects
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Lien, An-Shao; Wang, L. Y.; Chu, C. S.; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Valence state map of iron oxide thin film obtained from electron spectroscopy imaging series
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Chen, Ko-Feng; Lo, Shen-Chuan; Chang, Li; Egerton, Ray; Kai, Ji-Jung; Lin, Juhn-Jong; Chen, Fu-Rong |
| 國立交通大學 |
2014-12-08T15:14:58Z |
Growth of single-crystalline RuO2 nanowires with one- and two-nanocontact electrical characterizations
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Liu, Yee-Lang; Wu, Zong-Yi; Lin, Kuei-Jiun; Huang, Jr-Jeng; Chen, Fu-Rong; Kai, Ji-Jung; Lin, Yong-Han; Jian, Wen-Bin; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:14:01Z |
Contact to ZnO and intrinsic resistances of individual ZnO nanowires with a circular cross section
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Lin, Yen-Fu; Jian, Wen-Bin; Wang, C. P.; Suen, Yuen-Wuu; Wu, Zhong-Yi; Chen, Fu-Rong; Kai, Ji-Jung; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:12:43Z |
Size dependent magnetization and high-vacuum annealing enhanced ferromagnetism in Zn(1-x)Co(x)O nanowires
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Jian, Wen-Bin; Chen, I-Jan; Liao, Tai-Ching; Ou, Yi-Ching; Nien, Cheng-Hsun; Wu, Zhong-Yi; Chen, Fu-Rong; Kai, Ji-Jung; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:11:47Z |
Level Broadening Effect in Electron Tunneling through Double Quantum Dots with Different g Factors
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Huang, Shiu-Ming; Tokura, Yasuhiro; Akimoto, Hikota; Kono, Kimitoshi; Lin, Juhn-Jong; Tarucha, Seigo; Ono, Keiji |
| 國立交通大學 |
2014-12-08T15:11:20Z |
Size effects on thermal treatments and room-temperature ferromagnetism in high-vacuum annealed ZnCoO nanowires
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Chen, I-Jan; Ou, Yi-Ching; Wu, Zhong-Yi; Chen, Fu-Rong; Kai, Ji-Jung; Lin, Juhn-Jong; Jian, Wen-Bin |
| 國立交通大學 |
2014-12-08T15:10:55Z |
Thermal fluctuation-induced tunneling conduction through metal nanowire contacts
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Lin, Yong-Han; Chiu, Shao-Pin; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:10:25Z |
Two-channel Kondo effects in Al/AlO(x)/Sc planar tunnel junctions
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Yeh, Sheng-Shiuan; Lin, Juhn-Jong |
| 國立交通大學 |
2014-12-08T15:09:46Z |
Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K
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Chiu, Shao-Pin; Chung, Hui-Fang; Lin, Yong-Han; Kai, Ji-Jung; Chen, Fu-Rong; Lin, Juhn-Jong |
顯示項目 96-105 / 115 (共12頁)
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