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"lin yh"
Showing items 201-210 of 608 (61 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:49:22Z |
Correlation of stress-induced leakage current with generated positive trapped charges for ultrathin gate oxide
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Lin, YH; Lee, CL; Lei, TF |
| 國立交通大學 |
2014-12-08T15:47:04Z |
Onset of entanglement
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Lin, YH; Juang, JH |
| 國立交通大學 |
2014-12-08T15:46:36Z |
Chain dynamics of concentrated polystyrene solutions studied by depolarized photon-correlation and viscosity measurements
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Lai, CS; Juang, JH; Lin, YH |
| 國立交通大學 |
2014-12-08T15:45:22Z |
Monte Carlo simulation of the motions associated with a single Rouse segment
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Lin, YH; Luo, ZH |
| 國立交通大學 |
2014-12-08T15:44:42Z |
The effect of copper on gate oxide integrity
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Lin, YH; Wu, YH; Chin, A; Pan, FM |
| 國立交通大學 |
2014-12-08T15:43:59Z |
The strong degradation of 30 angstrom gate oxide integrity contaminated by copper
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Lin, YH; Chen, YC; Chan, KT; Pan, FM; Hsieh, IJ; Chin, A |
| 國立交通大學 |
2014-12-08T15:43:50Z |
A total standard WIP estimation method for wafer fabrication
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Lin, YH; Lee, CE |
| 國立交通大學 |
2014-12-08T15:43:18Z |
Cu contamination effect in oxynitride gate dielectrics
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Lin, YH; Pan, FM; Liao, YC; Chen, YC; Hsieh, IJ; Chin, A |
| 國立交通大學 |
2014-12-08T15:43:13Z |
Superconducting fluctuation magnetoconductance in a tungsten carbide film
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Rosenbaum, R; Hsu, SY; Chen, JY; Lin, YH; Lin, JJ |
| 國立交通大學 |
2014-12-08T15:42:01Z |
A WIP estimation model for wafer fabrication
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Lin, YH; Lee, CE |
Showing items 201-210 of 608 (61 Page(s) Totally)
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