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Institution Date Title Author
國立成功大學 2011 Influence of surface reconstruction on the atomic-layer-deposited HfO2/Al2O3/n-InAs metal-oxide-semiconductor capacitors Lin, Hau-Yu;Wu, San-Lein;Cheng, Chao-Ching;Ko, Chih-Hsin;Wann, Clement H.;Lin, You-Ru;Chang, Shoou-Jinn;Wu, Tai-Bor
國立成功大學 2009-03-16 GaAs0.7Sb0.3/GaAs type-II quantum well with an adjacent InAs quantum-dot stressor layer Lin, You-Ru; Lai, Yi-Feng; Liu, Chuan-Pu; Lin, Hao-Hsiung
國立臺灣大學 2009 以氣態源分子束磊晶法成長三五族化合物半導體量子結構與元件 林佑儒; Lin, You-Ru
國立臺灣大學 2009 GaAs0.7Sb0.3/GaAs type-II quantum well with an adjacent InAs quantum-dot stressor layer Lin, You-Ru; Lai, Yi-Feng; Liu, Chuan-Pu; Lin, Hao-Hsiung

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