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机构	日期	题名	作者
國立臺灣科技大學	2011	Simulation Analysis and Experiment Study of Nanocutting with AFM Probe on the Surface of Sapphire Substrate by Using Three Dimensional Quasi-steady Molecular Statics Nanocutting Model	Lin, Z.C.;Hsu, Y.C.
國立臺灣科技大學	2011	Measurement Simulation of Nanoscale Semicircle Profile by Constant-Amplitude Tapping Mode Atomic Force Microscopy (TM-AFM) and Influence of Probe Shape on Scanning Profile	Lin, Z.C.;Huang, J.J.
國立臺灣科技大學	2011	Binary Image Analysis and the Stress Analysis of Wafer of Compensated Chemical Mechanical Polishing (CCMP)	Lin, Z.C.;Lee, Y.H.
國立臺灣科技大學	2011	Establishment of a Near-Field Photolithography Processing Experiment Prediction Model and Parameter Optimization Model	Lin, Z.C.;Yang, C.B.
國立臺灣科技大學	2011	Curve fabrication model analysis of near-field photolithography	Lin, Z.C.;Yang, C.B.
國立臺灣科技大學	2011	Hot-melt-drawn Fabrication Model of Optical Fiber Probes and Analysis	Lin, Z.C.;Yang, C.B.;Lee, K.P.
國立臺灣科技大學	2011	Theoretical model for the hot-melt-drawn fabrication of optical fibre probes and the analysis of fabrication parameters	Lin, Z.C.;Yang, C.B.;Lee, K.P.
國立臺灣科技大學	2010	Measurement simulation model and qualitative analysis of tapping Mode Atomic Force Microscopy under vibration environment	Lin Z.-C.; Chou M.-H.
國立臺灣科技大學	2010	Simulation of nanoscale orthogonal cutting of single-crystal silicon	Lin Z.-C.; Peng S.-S.; Wang R.-Y.
國立臺灣科技大學	2010	Nano-scale simulative measuring model for tapping mode atomic force microscopy and analysis for measuring a nano-scale ladder-shape standard sample	Lin Z.-C.; Chou M.-H.
國立臺灣科技大學	2010	Distribution of polishing times for a wafer with different patterned polishing pads during CMP and CCMP	Lin Z.-C.; Chen C.-C.
國立臺灣科技大學	2010	Combining the Taguchi method with an artificial neural network to construct a prediction model for near-field photolithography experiments	Lin Z.-C.; Yang C.-B.
國立臺灣科技大學	2010	Construction and analysis of nanoscale simulative measuring model for scanning near-field optical microscope	Lin Z.-C.; Chou M.-H.
國立臺灣科技大學	2010	Three dimensional quasi-steady orthogonal nanocutting model and simulation analysis	Lin Z.-C.; Yang J.-M.
國立臺灣科技大學	2010	Evaluation priority of design decision using a modified analytical hierarchy process and a knowledge coding system for a web frame structure	Lin Z.-C.; Cheng C.-H.
國立臺灣科技大學	2010	Three Dimensional Nanoscale Abrasive Cutting Simulation and Analysis for Single-Crystal Silicon Workpiece	Lin, Z.C.;Wang, R.Y.
南亞技術學院	2010	Combining the Taguchi method with an artificial neural network to construct a prediction model for near-field photolithography experiments	Lin, Z-C; Yang, C-B
國立臺灣科技大學	2009-04	Anti-collision algorithm with the aid of interference cancellation and tag set partitioning in radio-frequency identification systems	Tseng, D.-F.;Lin, Z.-C.
國立臺灣科技大學	2009	Performance of coated tungsten carbide tools on milling printed circuit board	Lin Z.-C.; Ho C.-Y.
國立臺灣科技大學	2009	The determination of material strength coefficient and strain hardening constant by inverse method	Lin Z.-C.; Chen C.-C.; Wang H.-H.
國立臺灣科技大學	2009	Innovation procedure for polishing times calculations of compensated cmp using multiple steps of the modified triz method	Lin Z.-C.; Chen C.-C.
國立臺灣科技大學	2009	Inverse model of fiber probe aperture size using a non-destructive method	Lin Z.-C.; Yang C.-B.
國立臺灣科技大學	2009	Error analysis and regression mode of the V-grooved sample in the atomic force microscope simulation measurement mode by the molecular mechanics	Lin Z.-C.; Huang J.-C.; Yeh C.-H.
國立臺灣科技大學	2009	Quality improvement by using grey prediction tool compensation model for uncoated and TiAlCN-coated tungsten carbide tools in depanel process of memory modules	Lin Z.-C.; Ho C.-Y.
國立臺灣科技大學	2009	A simulative measuring model of scanning near-field optical microscope by applying aluminum atoms of FCC structure for the nano-scale standard sample and the qualitative analysis	Lin Z.-C.; Chou M.-H.

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