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Showing items 26-50 of 220 (9 Page(s) Totally)
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Institution	Date	Title	Author
國立臺灣科技大學	2014	Fabrication method and experiment study of nanoscale trapezoidal groove on sapphire substrate by using atomic force microscope under a fixed cutting depth and changed down force	Lin, Z.-C.;Tsai, J.-S.;Hsu, Y.-C.;Lin, C.-T.
國立臺灣科技大學	2014	A study of simulation of three-dimensional quasi-steady molecular statics nanoscale orthogonal cutting of single-crystal silicon material having rows of atoms with vacancy defect	Lin, Z.-C.;Jian, C.-S.;Wang, R.-Y.
國立臺灣科技大學	2013	Simulation and temperature rise analysis for nanocutting sapphire workpiece with quasi-steady molecular statics method	Lin, Z.-C.;Hsu, Y.-C.
國立臺灣科技大學	2013	Establishment and analysis of tapping mode atomic force microscopy simulative measurement model affected by external environment vibration	Lin, Z.-C.;Chou, M.-H.
國立臺灣科技大學	2013	Investigation of the abrasive removal depth for bowl-shaped structure of sapphire wafer under compensated chemical mechanical polishing	Lin, Z.C.;Wang, R.Y.
國立臺灣科技大學	2012	Analysis on the temperature rise produced by plastic deformation heat for nanoscale orthogonal cutting of copper workpiece	Lin, Z.-C.;Hsu, Y.-C.;Chen, L.-K.
國立臺灣科技大學	2012	A grey weighting density-based clustering algorithm for LAO wafer defect inspection	Huang, M.-L.;Tsai, M.-J.;Chen, C.C.;Lin, S.C.;Lin, Z.C.
國立臺灣科技大學	2012	A calculating method for the fewest cutting passes on sapphire substrate at a certain depth using specific down force energy with an AFM probe	Lin, Z.-C.;Hsu, Y.-C.
國立臺灣科技大學	2012	A study of material removal amount of sapphire wafer in application of chemical mechanical polishing with different polishing pads	Lin, Z.-C.;Huang, W.-S.;Tsai, J.-S.
國立臺灣科技大學	2012	Analytical study of simulated nanoscale abrasive cutting of sapphire substrate by three dimensional quasi-steady molecular statics	Lin, Z.-C.;Wang, R.-Y.
國立臺灣科技大學	2012	A study of combining molecular statics with heat transfer finite difference method for nanoscale orthogonal cutting of copper	Lin, Z.-C.;Hsu, Y.-C.
國立臺灣科技大學	2012	A study of estimating cutting depth for multi-pass nanoscale cutting by using atomic force microscopy	Lin, Z.-C.;Hsu, Y.-C.
國立臺灣科技大學	2012	LED English patents analysis using term segmentation and word segmentation system approach	Lin, Z.-C.;Lin, W.-H.;Du, C.-H.
國立臺灣科技大學	2012	Analysis on simulation of quasi-steady molecular statics nanocutting model and calculation of temperature rise during orthogonal cutting of single-crystal copper	Lin, Z.-C.;Hsu, Y.-C.
南亞技術學院	2011-05	Curve fabrication model analysis of near-field photolithography	Lin, Z-C; Yang, C-B
國立臺灣科技大學	2011	Simulation Analysis and Experiment Study of Nanocutting with AFM Probe on the Surface of Sapphire Substrate by Using Three Dimensional Quasi-steady Molecular Statics Nanocutting Model	Lin, Z.C.;Hsu, Y.C.
國立臺灣科技大學	2011	Measurement Simulation of Nanoscale Semicircle Profile by Constant-Amplitude Tapping Mode Atomic Force Microscopy (TM-AFM) and Influence of Probe Shape on Scanning Profile	Lin, Z.C.;Huang, J.J.
國立臺灣科技大學	2011	Binary Image Analysis and the Stress Analysis of Wafer of Compensated Chemical Mechanical Polishing (CCMP)	Lin, Z.C.;Lee, Y.H.
國立臺灣科技大學	2011	Establishment of a Near-Field Photolithography Processing Experiment Prediction Model and Parameter Optimization Model	Lin, Z.C.;Yang, C.B.
國立臺灣科技大學	2011	Curve fabrication model analysis of near-field photolithography	Lin, Z.C.;Yang, C.B.
國立臺灣科技大學	2011	Hot-melt-drawn Fabrication Model of Optical Fiber Probes and Analysis	Lin, Z.C.;Yang, C.B.;Lee, K.P.
國立臺灣科技大學	2011	Theoretical model for the hot-melt-drawn fabrication of optical fibre probes and the analysis of fabrication parameters	Lin, Z.C.;Yang, C.B.;Lee, K.P.
國立臺灣科技大學	2010	Measurement simulation model and qualitative analysis of tapping Mode Atomic Force Microscopy under vibration environment	Lin Z.-C.; Chou M.-H.
國立臺灣科技大學	2010	Simulation of nanoscale orthogonal cutting of single-crystal silicon	Lin Z.-C.; Peng S.-S.; Wang R.-Y.
國立臺灣科技大學	2010	Nano-scale simulative measuring model for tapping mode atomic force microscopy and analysis for measuring a nano-scale ladder-shape standard sample	Lin Z.-C.; Chou M.-H.

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