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| 臺大學術典藏 |
2001 |
Enhanced reliability of electroluminescence from metal–oxide–silicon tunneling diodes by deuterium incorporation
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Liu, C. W.; Lin, C.-H.; Lee, M. H.; Chang, S. T.; Liu, Y.-H.; Chen, Miin-Jang; Lin, Ching-Fuh; Liu, C. W.; Lin, C.-H.; Lee, M. H.; Chang, S. T.; Liu, Y.-H.; Chen, Miin-Jang; Lin, Ching-Fuh; LiuCW; ChenMiinJang; LinChingFuh |
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