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"liou d m gong j chen c c"
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| 東海大學 |
1991 |
Electromigration effect on low frequency noise in Al thin films
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Liou, D.M., Gong, J., Chen, C.C. |
| 東海大學 |
1990 |
1/f2 noise spectrum derived from electromigration-induced resistance change
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Liou, D.M., Gong, J., Chen, C.C. |
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