臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立交通大學	2017-04-21T06:48:54Z	Failure Analysis of Gate-all-around Nanowire Field Effect Transistor Under TLP Test	Zhang, Guoyan; Dong, Aihua; Liu, Nie; Tian, Rui; Yang, Xuejiao; Liu, Zhiwei; Lee, Kohui; Lin, Horng-Chih; Liou, Juin J.; Wang Yuxin
國立交通大學	2014-12-08T15:08:53Z	Electrostatic Discharge Robustness of Si Nanowire Field-Effect Transistors	Liu, Wen; Liou, Juin J.; Chung, Andy; Jeong, Yoon-Ha; Chen, Wei-Chen; Lin, Horng-Chih

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