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Taiwan Academic Institutional Repository >
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Showing items 626-635 of 707 (71 Page(s) Totally)
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| 國立成功大學 |
2008-12-01 |
Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立臺灣大學 |
2008-11 |
RASD2, MYH9, and CACNG2 genes at chromosome 22q12 associated with the subgroup of schizophrenia with non-deficit in sustained attention and executive function
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Liu, Y.-L.; Fann, C.S.-J.; Liu, C.-M.; Chen, W.J.; Wu, J.-Y.; Hung, S.-I.; Chen, C.-H.; Jou, Y.-S.; Liu, S.-K.; Hwang, T.-J.; Hsieh, M.H.; Chang, C.C.; Yang, W.-C.; Lin, J.-J.; Chou, F.H.-C.; Faraone, S.V.; Tsuang, M.T.; Hwu, H.-G. |
| 國立成功大學 |
2008-09 |
On-resistance degradation induced by hot-carrier injection in LDMOS transistors with STI in the drift region
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-07-31 |
Gate current dependent hot-carrier-induced degradation in LDMOS transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, T. Y.; Liu, C. M. |
| 國立成功大學 |
2008-07 |
Effect of drift-region concentration on hot-carrier-induced R-on degradation in nLDMOS transistors
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Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M. |
| 國立成功大學 |
2008-06-16 |
Mechanism and lifetime prediction method for hot-carrier-induced degradation in lateral diffused metal-oxide-semiconductor transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-05 |
Anomalous hot-caffier-induced increase in saturation-region drain current in n-type lateral diffused metal-oxide-semiconductor transistors
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Chen, Shiang-Yu; Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L. |
| 國立成功大學 |
2008-03-17 |
Anomalous increase in hot-carrier-induced threshold voltage shift in n-type drain extended metal-oxide-semiconductor transistors
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Chen, Jone F.; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M. |
| 國立成功大學 |
2008-03-10 |
Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 mu m n-type lateral diffused metal-oxide-semiconductor transistors
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Lee, J. R.; Chen, Jone F.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L. |
| 國立東華大學 |
2008 |
Microstructure and Corrosion Resistance of Anodized Mg-9mass%Li-1mass%Zn alloy
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Wang,Jian-Yih; Liu,C .M.; Ger,M. D.; Liu,Y. M.; Chen,W. K. |
Showing items 626-635 of 707 (71 Page(s) Totally)
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