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"liu c m"的相關文件
顯示項目 621-630 / 707 (共71頁)
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| 國立臺灣科技大學 |
2009 |
The Mahalanobis-Taguchi system - Neural network algorithm for data-mining in dynamic environments
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Huang C.-L.; Hsu T.-S.; Liu C.-M. |
| 國立臺灣大學 |
2009 |
Genetic variants in COMT and neurocognitive impairment in families of patients with schizophrenia
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Liao, S-Y; Lin, S-H; Liu, C-M; Hsieh, MH; Hwang, TJ; Liu, SK; Guo, S-C; Hwu, H-G; Chen, WJ |
| 國立臺灣大學 |
2009 |
Variations and trends of biologically effective doses of solar ultraviolet radiation in Asia, Europe and South America from 1999 to 2007
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Munakata, N.; Kazadzis, S.; Bolse?, D.; Schuch, N.; Koskela, T.; Karpetchko, A.; Meleti, C.; Casiccia, C.; da Rosa, M. B.; Saida, T.; Nishigori, C.; Ogata, K.; Imafuku, K.; Liu, C.-M.; Lestari, S.; Kanoko, M.; Cornain, S.; Mulyadi, K.; Hieda, K. |
| 臺大學術典藏 |
2009 |
Genetic variants in COMT and neurocognitive impairment in families of patients with schizophrenia
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Guo S.-C.; Hwu H.-G.; Chen W.J.; Liu S.K.; Hwang T.J.; MING-HSIEN HSIEH; Liu C.-M.; Lin S.-H.; Liao S.-Y.; Liao S.-Y.;Lin S.-H.;Liu C.-M.;Ming-Hsien Hsieh;Hwang T.J.;Liu S.K.;Guo S.-C.;Hwu H.-G.;Chen W.J. |
| 臺大學術典藏 |
2009 |
Construction of Balanced Translocation t(1;11)(q42.1;q14.3) Probe and Screening Application in Genomic Samples in Taiwan
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Liu Y.-L.; Liu C.-M.; HWEI-FANG TIEN; Hwu H.-G. |
| 國立成功大學 |
2008-12-01 |
Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立臺灣大學 |
2008-11 |
RASD2, MYH9, and CACNG2 genes at chromosome 22q12 associated with the subgroup of schizophrenia with non-deficit in sustained attention and executive function
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Liu, Y.-L.; Fann, C.S.-J.; Liu, C.-M.; Chen, W.J.; Wu, J.-Y.; Hung, S.-I.; Chen, C.-H.; Jou, Y.-S.; Liu, S.-K.; Hwang, T.-J.; Hsieh, M.H.; Chang, C.C.; Yang, W.-C.; Lin, J.-J.; Chou, F.H.-C.; Faraone, S.V.; Tsuang, M.T.; Hwu, H.-G. |
| 國立成功大學 |
2008-09 |
On-resistance degradation induced by hot-carrier injection in LDMOS transistors with STI in the drift region
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-07-31 |
Gate current dependent hot-carrier-induced degradation in LDMOS transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, T. Y.; Liu, C. M. |
| 國立成功大學 |
2008-07 |
Effect of drift-region concentration on hot-carrier-induced R-on degradation in nLDMOS transistors
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Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M. |
顯示項目 621-630 / 707 (共71頁)
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